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Lei Guo; Wenjie Zhou; Xiao Li – Journal of Educational and Behavioral Statistics, 2024
The testlet design is very popular in educational and psychological assessments. This article proposes a new cognitive diagnosis model, the multiple-choice cognitive diagnostic testlet (MC-CDT) model for tests using testlets consisting of MC items. The MC-CDT model uses the original examinees' responses to MC items instead of dichotomously scored…
Descriptors: Multiple Choice Tests, Diagnostic Tests, Accuracy, Computer Software
Zhan, Peida; Jiao, Hong; Man, Kaiwen; Wang, Lijun – Journal of Educational and Behavioral Statistics, 2019
In this article, we systematically introduce the just another Gibbs sampler (JAGS) software program to fit common Bayesian cognitive diagnosis models (CDMs) including the deterministic inputs, noisy "and" gate model; the deterministic inputs, noisy "or" gate model; the linear logistic model; the reduced reparameterized unified…
Descriptors: Bayesian Statistics, Computer Software, Models, Test Items
Luo, Yong; Dimitrov, Dimiter M. – Educational and Psychological Measurement, 2019
Plausible values can be used to either estimate population-level statistics or compute point estimates of latent variables. While it is well known that five plausible values are usually sufficient for accurate estimation of population-level statistics in large-scale surveys, the minimum number of plausible values needed to obtain accurate latent…
Descriptors: Item Response Theory, Monte Carlo Methods, Markov Processes, Outcome Measures
Jiao, Hong; Wang, Shudong; He, Wei – Journal of Educational Measurement, 2013
This study demonstrated the equivalence between the Rasch testlet model and the three-level one-parameter testlet model and explored the Markov Chain Monte Carlo (MCMC) method for model parameter estimation in WINBUGS. The estimation accuracy from the MCMC method was compared with those from the marginalized maximum likelihood estimation (MMLE)…
Descriptors: Computation, Item Response Theory, Models, Monte Carlo Methods
Feng, Mingyu, Ed.; Käser, Tanja, Ed.; Talukdar, Partha, Ed. – International Educational Data Mining Society, 2023
The Indian Institute of Science is proud to host the fully in-person sixteenth iteration of the International Conference on Educational Data Mining (EDM) during July 11-14, 2023. EDM is the annual flagship conference of the International Educational Data Mining Society. The theme of this year's conference is "Educational data mining for…
Descriptors: Information Retrieval, Data Analysis, Computer Assisted Testing, Cheating
DeCarlo, Lawrence T. – Applied Psychological Measurement, 2011
Cognitive diagnostic models (CDMs) attempt to uncover latent skills or attributes that examinees must possess in order to answer test items correctly. The DINA (deterministic input, noisy "and") model is a popular CDM that has been widely used. It is shown here that a logistic version of the model can easily be fit with standard software for…
Descriptors: Bayesian Statistics, Computation, Cognitive Tests, Diagnostic Tests