Publication Date
In 2025 | 0 |
Since 2024 | 0 |
Since 2021 (last 5 years) | 0 |
Since 2016 (last 10 years) | 1 |
Since 2006 (last 20 years) | 1 |
Descriptor
Adaptive Testing | 3 |
Correlation | 3 |
Error of Measurement | 3 |
Test Items | 3 |
Computer Assisted Testing | 2 |
Simulation | 2 |
Accuracy | 1 |
Career Development | 1 |
Classification | 1 |
Culture Fair Tests | 1 |
Estimation (Mathematics) | 1 |
More ▼ |
Source
International Journal of… | 1 |
Publication Type
Reports - Research | 2 |
Journal Articles | 1 |
Reports - Evaluative | 1 |
Education Level
Audience
Location
Laws, Policies, & Programs
Assessments and Surveys
What Works Clearinghouse Rating
Aksu Dunya, Beyza – International Journal of Testing, 2018
This study was conducted to analyze potential item parameter drift (IPD) impact on person ability estimates and classification accuracy when drift affects an examinee subgroup. Using a series of simulations, three factors were manipulated: (a) percentage of IPD items in the CAT exam, (b) percentage of examinees affected by IPD, and (c) item pool…
Descriptors: Adaptive Testing, Classification, Accuracy, Computer Assisted Testing
Zwick, Rebecca; And Others – 1993
Simulated data were used to investigate the performance of modified versions of the Mantel-Haenszel and standardization methods of differential item functioning (DIF) analysis in computer-adaptive tests (CATs). Each "examinee" received 25 items out of a 75-item pool. A three-parameter logistic item response model was assumed, and…
Descriptors: Adaptive Testing, Computer Assisted Testing, Correlation, Error of Measurement
Samejima, Fumiko – 1977
A method of estimating the operating characteristics of a new test item added to an established test without assuming a prior model has been proposed by the author. In this paper, the author extends this logic by proposing a different hypothesized distribution of the resulting estimate. The former method used a normal approximation; the present…
Descriptors: Adaptive Testing, Career Development, Correlation, Error of Measurement