Publication Date
In 2025 | 0 |
Since 2024 | 1 |
Since 2021 (last 5 years) | 1 |
Since 2016 (last 10 years) | 1 |
Since 2006 (last 20 years) | 3 |
Descriptor
Classification | 3 |
Correlation | 3 |
Item Response Theory | 3 |
Sample Size | 3 |
Test Length | 3 |
Accuracy | 2 |
Statistical Analysis | 2 |
Test Items | 2 |
Bayesian Statistics | 1 |
Comparative Analysis | 1 |
Computation | 1 |
More ▼ |
Publication Type
Journal Articles | 3 |
Reports - Research | 3 |
Education Level
Audience
Location
Laws, Policies, & Programs
Assessments and Surveys
What Works Clearinghouse Rating
Sedat Sen; Allan S. Cohen – Educational and Psychological Measurement, 2024
A Monte Carlo simulation study was conducted to compare fit indices used for detecting the correct latent class in three dichotomous mixture item response theory (IRT) models. Ten indices were considered: Akaike's information criterion (AIC), the corrected AIC (AICc), Bayesian information criterion (BIC), consistent AIC (CAIC), Draper's…
Descriptors: Goodness of Fit, Item Response Theory, Sample Size, Classification
Svetina, Dubravka – Educational and Psychological Measurement, 2013
The purpose of this study was to investigate the effect of complex structure on dimensionality assessment in noncompensatory multidimensional item response models using dimensionality assessment procedures based on DETECT (dimensionality evaluation to enumerate contributing traits) and NOHARM (normal ogive harmonic analysis robust method). Five…
Descriptors: Item Response Theory, Statistical Analysis, Computation, Test Length
Li, Ying; Rupp, Andre A. – Educational and Psychological Measurement, 2011
This study investigated the Type I error rate and power of the multivariate extension of the S - [chi][squared] statistic using unidimensional and multidimensional item response theory (UIRT and MIRT, respectively) models as well as full-information bifactor (FI-bifactor) models through simulation. Manipulated factors included test length, sample…
Descriptors: Test Length, Item Response Theory, Statistical Analysis, Error Patterns