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Ning, Bo; Van Damme, Jan; Gielen, Sarah; Vanlaar, Gudrun; Van den Noortgate, Wim – Scandinavian Journal of Educational Research, 2016
Finland and Shanghai are strong performers in the Program for International Student Assessment (PISA). The current study explored the similarities and differences in educational effectiveness between these 2 strong performers. To this end, 14 predictors representing student background and school process characteristics were selected from the PISA…
Descriptors: Foreign Countries, Reading Achievement, Comparative Education, Instructional Effectiveness
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Jiao, Hong; Wang, Shudong; He, Wei – Journal of Educational Measurement, 2013
This study demonstrated the equivalence between the Rasch testlet model and the three-level one-parameter testlet model and explored the Markov Chain Monte Carlo (MCMC) method for model parameter estimation in WINBUGS. The estimation accuracy from the MCMC method was compared with those from the marginalized maximum likelihood estimation (MMLE)…
Descriptors: Computation, Item Response Theory, Models, Monte Carlo Methods
Jeon, Minjeong – ProQuest LLC, 2012
Maximum likelihood (ML) estimation of generalized linear mixed models (GLMMs) is technically challenging because of the intractable likelihoods that involve high dimensional integrations over random effects. The problem is magnified when the random effects have a crossed design and thus the data cannot be reduced to small independent clusters. A…
Descriptors: Hierarchical Linear Modeling, Computation, Measurement, Maximum Likelihood Statistics
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Huang, Hung-Yu; Wang, Wen-Chung – Educational and Psychological Measurement, 2014
In the social sciences, latent traits often have a hierarchical structure, and data can be sampled from multiple levels. Both hierarchical latent traits and multilevel data can occur simultaneously. In this study, we developed a general class of item response theory models to accommodate both hierarchical latent traits and multilevel data. The…
Descriptors: Item Response Theory, Hierarchical Linear Modeling, Computation, Test Reliability