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Huynh, Huynh – 1977
The kappamax reliability index of domain-referenced tests is defined as the upper bound of kappa when all possibile cutoff scores are considered. Computational procedures for kappamax are described, as well as its approximation for long tests, based on Kuder-Richardson formula 21. The sampling error of kappamax, and the effects of test length and…
Descriptors: Criterion Referenced Tests, Mathematical Models, Statistical Analysis, Test Reliability
Peer reviewed Peer reviewed
Huynh, Huynh – Journal of Educational Statistics, 1982
Two indices for assessing the efficiency of decisions in mastery testing are proposed. The indices are generalizations of the raw agreement index and the kappa index. Empirical examples of these indices are given. (Author/JKS)
Descriptors: Criterion Referenced Tests, Cutting Scores, Mastery Tests, Test Reliability
Peer reviewed Peer reviewed
Huynh, Huynh – Journal of Educational Measurement, 1976
Within the beta-binomial Bayesian framework, procedures are described for the evaluation of the kappa index of reliability on the basis of one administration of a domain-referenced test. Major factors affecting this index include cutoff score, test score variability and test length. Empirical data which substantiate some theoretical trends deduced…
Descriptors: Criterion Referenced Tests, Decision Making, Mathematical Models, Probability
Peer reviewed Peer reviewed
Huynh, Huynh – Educational and Psychological Measurement, 1990
Within the multivariate normality framework, a formula is provided for computation of the criterion-related validity of composite scores based on the highest (or lowest) of several equivalent measures. This partial composite score has more validity than each single observation, but less validity than a composite based on all observations. (SLD)
Descriptors: Concurrent Validity, Criterion Referenced Tests, Equations (Mathematics), Mathematical Models
Peer reviewed Peer reviewed
Huynh, Huynh – Journal of Educational and Behavioral Statistics, 1998
Presents a procedure, based on a Bayesian updating of the item information, for locating on the latent trait scale the scores or responses of items that follow the three-parameter logistic and monotone partial credit models. Applications are provided in terms of selecting items or score categories for criterion-referenced interpretation of mapping…
Descriptors: Bayesian Statistics, Criterion Referenced Tests, Item Analysis, Likert Scales
Peer reviewed Peer reviewed
Huynh, Huynh – Psychometrika, 1982
A Bayesian framework for making mastery/nonmastery decisions based on multivariate test data is described. Overall, mastery is granted if the posterion expected loss associated with such action is smaller than the one incurred by denying mastery. (Author/JKS)
Descriptors: Bayesian Statistics, Criterion Referenced Tests, Cutting Scores, Error of Measurement
Peer reviewed Peer reviewed
Huynh, Huynh – Psychometrika, 1980
A nonrandomized minimax solution is presented for passing scores on mastery tests using the binomial error model. The computation does not require prior knowledge regarding an individual examinee or group test data for a population of examinees. A scheme which allows for correction for guessing is also described. (Author/JKS)
Descriptors: Academic Standards, Classification, Criterion Referenced Tests, Cutting Scores
Huynh, Huynh – 2000
By noting that a Rasch or two parameter logistic (2PL) item belongs to the exponential family of random variables and that the probability density function (pdf) of the correct response (X=1) and the incorrect response (X=0) are symmetric with respect to the vertical line at the item location, it is shown that the conjugate prior for ability is…
Descriptors: Bayesian Statistics, Criterion Referenced Tests, Selection, Standard Setting (Scoring)
Peer reviewed Peer reviewed
Huynh, Huynh; Perney, Jan – Educational and Psychological Measurement, 1979
A procedure is described for the determination of individual mastery scores when instructional units are sequenced in a linear hierarchy. It can be used when data for the entire sequence have been obtained. The process entails working backwards, from the final test to the first. (Author/JKS)
Descriptors: Criterion Referenced Tests, Cutting Scores, Mastery Learning, Mastery Tests