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Divgi, D. R. – 1978
One aim of criterion-referenced testing is to classify an examinee without reference to a norm group; therefore, any statements about the dependability of such classification ought to be group-independent also. A population-independent index is proposed in terms of the probability of incorrect classification near the cutoff true score. The…
Descriptors: Criterion Referenced Tests, Cutting Scores, Difficulty Level, Error of Measurement
deGruijter, Dato N. M. – 1980
The setting of standards involves subjective value judgments. The inherent arbitrariness of specific standards has been severely criticized by Glass. His antagonists agree that standard setting is a judgmental task but they have pointed out that arbitrariness in the positive sense of serious judgmental decisions is unavoidable. Further, small…
Descriptors: Cutting Scores, Difficulty Level, Error of Measurement, Mastery Tests
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Huck, Schuyler W.; And Others – Educational and Psychological Measurement, 1981
Believing that examinee-by-item interaction should be conceptualized as true score variability rather than as a result of errors of measurement, Lu proposed a modification of Hoyt's analysis of variance reliability procedure. Via a computer simulation study, it is shown that Lu's approach does not separate interaction from error. (Author/RL)
Descriptors: Analysis of Variance, Comparative Analysis, Computer Programs, Difficulty Level
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Li, Yuan H.; Lissitz, Robert W. – Journal of Educational Measurement, 2004
The analytically derived asymptotic standard errors (SEs) of maximum likelihood (ML) item estimates can be approximated by a mathematical function without examinees' responses to test items, and the empirically determined SEs of marginal maximum likelihood estimation (MMLE)/Bayesian item estimates can be obtained when the same set of items is…
Descriptors: Test Items, Computation, Item Response Theory, Error of Measurement