ERIC Number: EJ1467153
Record Type: Journal
Publication Date: 2025-Apr
Pages: 2
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-1076-2175
EISSN: EISSN-2162-951X
Available Date: 0000-00-00
Technical Adequacy-Reliability
Gifted Child Today, v48 n2 p148-149 2025
The author provides information about reliability and areas that educators should examine in determining if an assessment is consistent and trustworthy for use, and how it should be interpreted in making decisions about students. Reliability areas that are discussed in the column include internal consistency, test-retest or stability, inter-scorer or inter-rater, and alternate or parallel forms.
Descriptors: Test Reliability, Academically Gifted, Student Evaluation, Error of Measurement, Interrater Reliability, Evaluation Methods
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Publication Type: Journal Articles; Reports - Descriptive
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A
Author Affiliations: 1Baylor University