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Lathrop, Quinn N.; Cheng, Ying – Journal of Educational Measurement, 2014
When cut scores for classifications occur on the total score scale, popular methods for estimating classification accuracy (CA) and classification consistency (CC) require assumptions about a parametric form of the test scores or about a parametric response model, such as item response theory (IRT). This article develops an approach to estimate CA…
Descriptors: Cutting Scores, Classification, Computation, Nonparametric Statistics
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Mapuranga, Raymond; Dorans, Neil J.; Middleton, Kyndra – ETS Research Report Series, 2008
In many practical settings, essentially the same differential item functioning (DIF) procedures have been in use since the late 1980s. Since then, examinee populations have become more heterogeneous, and tests have included more polytomously scored items. This paper summarizes and classifies new DIF methods and procedures that have appeared since…
Descriptors: Test Bias, Educational Development, Evaluation Methods, Statistical Analysis