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Atalay Kabasakal, Kübra; Arsan, Nihan; Gök, Bilge; Kelecioglu, Hülya – Educational Sciences: Theory and Practice, 2014
This simulation study compared the performances (Type I error and power) of Mantel-Haenszel (MH), SIBTEST, and item response theory-likelihood ratio (IRT-LR) methods under certain conditions. Manipulated factors were sample size, ability differences between groups, test length, the percentage of differential item functioning (DIF), and underlying…
Descriptors: Comparative Analysis, Item Response Theory, Statistical Analysis, Test Bias
Finkelman, Matthew D.; Smits, Niels; Kim, Wonsuk; Riley, Barth – Applied Psychological Measurement, 2012
The Center for Epidemiologic Studies-Depression (CES-D) scale is a well-known self-report instrument that is used to measure depressive symptomatology. Respondents who take the full-length version of the CES-D are administered a total of 20 items. This article investigates the use of curtailment and stochastic curtailment (SC), two sequential…
Descriptors: Measures (Individuals), Depression (Psychology), Test Length, Computer Assisted Testing
Bulut, Okan; Kan, Adnan – Eurasian Journal of Educational Research, 2012
Problem Statement: Computerized adaptive testing (CAT) is a sophisticated and efficient way of delivering examinations. In CAT, items for each examinee are selected from an item bank based on the examinee's responses to the items. In this way, the difficulty level of the test is adjusted based on the examinee's ability level. Instead of…
Descriptors: Adaptive Testing, Computer Assisted Testing, College Entrance Examinations, Graduate Students
Wang, Wen-Chung; Su, Ya-Hui – Applied Psychological Measurement, 2004
Eight independent variables (differential item functioning [DIF] detection method, purification procedure, item response model, mean latent trait difference between groups, test length, DIF pattern, magnitude of DIF, and percentage of DIF items) were manipulated, and two dependent variables (Type I error and power) were assessed through…
Descriptors: Test Length, Test Bias, Simulation, Item Response Theory