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Fan, Yi; Lance, Charles E. – Educational and Psychological Measurement, 2017
The correlated trait-correlated method (CTCM) model for the analysis of multitrait-multimethod (MTMM) data is known to suffer convergence and admissibility (C&A) problems. We describe a little known and seldom applied reparameterized version of this model (CTCM-R) based on Rindskopf's reparameterization of the simpler confirmatory factor…
Descriptors: Multitrait Multimethod Techniques, Correlation, Goodness of Fit, Models
Convergence, Admissibility, and Fit of Alternative Confirmatory Factor Analysis Models for MTMM Data
Lance, Charles E.; Fan, Yi – Educational and Psychological Measurement, 2016
We compared six different analytic models for multitrait-multimethod (MTMM) data in terms of convergence, admissibility, and model fit to 258 samples of previously reported data. Two well-known models, the correlated trait-correlated method (CTCM) and the correlated trait-correlated uniqueness (CTCU) models, were fit for reference purposes in…
Descriptors: Multitrait Multimethod Techniques, Factor Analysis, Models, Goodness of Fit
Dumenci, Levent; Yates, Phillip D. – Educational and Psychological Measurement, 2012
Estimation problems associated with the correlated-trait correlated-method (CTCM) parameterization of a multitrait-multimethod (MTMM) matrix are widely documented: the model often fails to converge; even when convergence is achieved, one or more of the parameter estimates are outside the admissible parameter space. In this study, the authors…
Descriptors: Correlation, Models, Multitrait Multimethod Techniques, Matrices
Leite, Walter L.; Svinicki, Marilla; Shi, Yuying – Educational and Psychological Measurement, 2010
The authors examined the dimensionality of the VARK learning styles inventory. The VARK measures four perceptual preferences: visual (V), aural (A), read/write (R), and kinesthetic (K). VARK questions can be viewed as testlets because respondents can select multiple items within a question. The correlations between items within testlets are a type…
Descriptors: Multitrait Multimethod Techniques, Construct Validity, Reliability, Factor Analysis