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Yen, Wendy M. | 2 |
Candell, Gregory L. | 1 |
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Yen, Wendy M.; Candell, Gregory L. – Applied Measurement in Education, 1991
Empirical reliabilities of scores based on item-pattern scoring, using 3-parameter item-response theory and number-correct scoring, were compared within each of 5 score metrics for at least 900 elementary school students for 5 content areas. Average increases in reliability were produced by item-pattern scoring. (SLD)
Descriptors: Elementary Education, Elementary School Students, Grade Equivalent Scores, Item Response Theory

Yen, Wendy M. – Educational Measurement: Issues and Practice, 1988
In their discussion of problems related to identifying learning disabilities with individually administered achievement tests, Phillips and Clarizio incorrectly conclude that developmental standard score scales produce unrealistic expectations for the growth of low-achieving students. By definition, these scores state how much the norm group's…
Descriptors: Academic Achievement, Achievement Gains, Achievement Tests, Educational Assessment