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Harnisch, Delwyn L.; Romy, Neil – 1985
This is a user's guide to the Student-Problem Package (SPP), a software package for the IBM-PC that provides three sub-programs for analyzing item response patterns. These analyses are based on student-problem (S-P) curve theory. The SPP User's Guide provides: (1) a brief introduction to response pattern analysis; (2) an overview of the…
Descriptors: Computer Assisted Testing, Item Analysis, Menu Driven Software, Microcomputers

Harnisch, Delwyn L. – Journal of Educational Measurement, 1983
The Student-Problem (S-P) methodology is described using an example of 24 students on a test of 44 items. Information based on the students' test score and the modified caution index is put to diagnostic use. A modification of the S-P methodology is applied to domain-referenced testing. (Author/CM)
Descriptors: Academic Achievement, Educational Practices, Item Analysis, Responses
Harnisch, Delwyn L.; Rotheroe, Dave – 1986
This manual describes and explains the commands available in the ITEMBANK package (a comprehensive test item bank). True-false, multiple-choice, short-answer, and essay items, as well as the associated answers, can be accommodated. Content domains and behavior categories exist for item classification. Most menus have instant action. Items and…
Descriptors: Computer Assisted Testing, Essay Tests, Item Analysis, Item Banks
Harnisch, Delwyn L.; And Others – 1985
The Test Analysis Package (TAP) consists of three microcomputer programs that edit, score, summarize, and analyze student test data. Features of the TAP system include: (1) an editor that allows creation of a student test data file without the use of a separate word processor; (2) a scoring mechanism that can score a test data file of 999 students…
Descriptors: Computer Assisted Testing, Computer Graphics, Item Analysis, Item Banks
Linn, Robert L.; Harnisch, Delwyn L. – 1979
The purpose of this investigation was to examine the interaction of item content and group membership on achievement test items. Estimates of the parameters of the three parameter logistic model were obtained on the 46 item math test for the sample of eighth grade students (N = 2055) participating in the Illinois Inventory of Educational Progress,…
Descriptors: Achievement Tests, Black Students, Grade 8, Item Analysis
Harnisch, Delwyn L.; Linn, Robert L. – 1981
Techniques to identify the degree to which a response pattern is unusual and the pattern's relationship to examinee background are presented. Sato's caution index and modified caution index use clusters of items for comparisons of observed performance outcomes and do not require the use of item response theory. Correlation between the indices was…
Descriptors: Educational Assessment, Educational Diagnosis, Error Patterns, Item Analysis
Harnisch, Delwyn L. – 1983
The purpose of this investigation was to examine the item characteristics of the General Educational Development Tests (GED) for specific subgroups of students. The method employed was the approach suggested by Linn and Harnisch in which the three-parameter logistic model is used for detecting interactions between item content and group…
Descriptors: Aptitude Treatment Interaction, Equivalency Tests, High School Equivalency Programs, Item Analysis
Harnisch, Delwyn L. – 1987
A multi-purpose, multi-user evaluation system was designed to improve the quality of the reporting of information gathered in testing and evaluation practices. One part of the system, the reporting system for information resulting from a district standardized testing program, was described. The Student-Problem Package software was modified to…
Descriptors: Basic Skills, Charts, Computer Managed Instruction, Computer Software
Harnisch, Delwyn L. – 1985
Computer adaptive testing systems are feasible for certification and licensure testing. This is in part due to the availability of extensive yet inexpensive computers. Modern item response theory, combined with computerized adaptive testing, yields a powerful new method of testing which provides greater accuracy and efficiency and less boredom for…
Descriptors: Adaptive Testing, Certification, Computer Assisted Testing, Cost Effectiveness