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Kang, Hyeon-Ah; Han, Suhwa; Kim, Doyoung; Kao, Shu-Chuan – Educational and Psychological Measurement, 2022
The development of technology-enhanced innovative items calls for practical models that can describe polytomous testlet items. In this study, we evaluate four measurement models that can characterize polytomous items administered in testlets: (a) generalized partial credit model (GPCM), (b) testlet-as-a-polytomous-item model (TPIM), (c)…
Descriptors: Goodness of Fit, Item Response Theory, Test Items, Scoring
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Bergner, Yoav; Choi, Ikkyu; Castellano, Katherine E. – Journal of Educational Measurement, 2019
Allowance for multiple chances to answer constructed response questions is a prevalent feature in computer-based homework and exams. We consider the use of item response theory in the estimation of item characteristics and student ability when multiple attempts are allowed but no explicit penalty is deducted for extra tries. This is common…
Descriptors: Models, Item Response Theory, Homework, Computer Assisted Instruction
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Brinkhuis, Matthieu J. S.; Savi, Alexander O.; Hofman, Abe D.; Coomans, Frederik; van der Maas, Han L. J.; Maris, Gunter – Journal of Learning Analytics, 2018
With the advent of computers in education, and the ample availability of online learning and practice environments, enormous amounts of data on learning become available. The purpose of this paper is to present a decade of experience with analyzing and improving an online practice environment for math, which has thus far recorded over a billion…
Descriptors: Data Analysis, Mathematics Instruction, Accuracy, Reaction Time
Tatsuoka, Kikumi K.; Tatsuoka, Maurice M. – 1978
The family of Weibull distributions was investigated as a model for the distributions of response times for items in computer-based criterion-referenced tests. The fit of these distributions were, with a few exceptions, good to excellent according to the Kolmogorov-Smirnov test. For a few relatively simple items, the two-parameter gamma…
Descriptors: Career Development, Computer Assisted Instruction, Computer Assisted Testing, Criterion Referenced Tests