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Sinharay, Sandip; van Rijn, Peter W. – Journal of Educational and Behavioral Statistics, 2020
Response time models (RTMs) are of increasing interest in educational and psychological testing. This article focuses on the lognormal model for response times, which is one of the most popular RTMs. Several existing statistics for testing normality and the fit of factor analysis models are repurposed for testing the fit of the lognormal model. A…
Descriptors: Educational Testing, Psychological Testing, Goodness of Fit, Factor Analysis
Sinharay, Sandip; van Rijn, Peter – Grantee Submission, 2020
Response-time models are of increasing interest in educational and psychological testing. This paper focuses on the lognormal model for response times (van der Linden, 2006), which is one of the most popular response-time models. Several existing statistics for testing normality and the fit of factor-analysis models are repurposed for testing the…
Descriptors: Educational Testing, Psychological Testing, Goodness of Fit, Factor Analysis
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Johnson, Matthew S.; Sinharay, Sandip – Applied Psychological Measurement, 2005
For complex educational assessments, there is an increasing use of item families, which are groups of related items. Calibration or scoring in an assessment involving item families requires models that can take into account the dependence structure inherent among the items that belong to the same item family. This article extends earlier works in…
Descriptors: National Competency Tests, Markov Processes, Bayesian Statistics
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Sinharay, Sandip – Journal of Educational and Behavioral Statistics, 2004
There is an increasing use of Markov chain Monte Carlo (MCMC) algorithms for fitting statistical models in psychometrics, especially in situations where the traditional estimation techniques are very difficult to apply. One of the disadvantages of using an MCMC algorithm is that it is not straightforward to determine the convergence of the…
Descriptors: Psychometrics, Mathematics, Inferences, Markov Processes
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Sinharay, Sandip; Johnson, Matthew S.; Williamson, David M. – Journal of Educational and Behavioral Statistics, 2003
Item families, which are groups of related items, are becoming increasingly popular in complex educational assessments. For example, in automatic item generation (AIG) systems, a test may consist of multiple items generated from each of a number of item models. Item calibration or scoring for such an assessment requires fitting models that can…
Descriptors: Test Items, Markov Processes, Educational Testing, Probability
Johnson, Matthew S.; Sinharay, Sandip – 2003
For complex educational assessments, there is an increasing use of "item families," which are groups of related items. However, calibration or scoring for such an assessment requires fitting models that take into account the dependence structure inherent among the items that belong to the same item family. C. Glas and W. van der Linden…
Descriptors: Bayesian Statistics, Constructed Response, Educational Assessment, Estimation (Mathematics)
Williamson, David M.; Johnson, Matthew S.; Sinharay, Sandip; Bejar, Isaac I. – 2002
This paper explores the application of a technique for hierarchical item response theory (IRT) calibration of complex constructed response tasks that has promise both as a calibration tool and as a means of evaluating the isomorphic equivalence of complex constructed response tasks. Isomorphic tasks are explicitly and rigorously designed to be…
Descriptors: Bayesian Statistics, Constructed Response, Estimation (Mathematics), Evaluation Methods