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van der Linden, Wim J.; Ren, Hao – Journal of Educational and Behavioral Statistics, 2020
The Bayesian way of accounting for the effects of error in the ability and item parameters in adaptive testing is through the joint posterior distribution of all parameters. An optimized Markov chain Monte Carlo algorithm for adaptive testing is presented, which samples this distribution in real time to score the examinee's ability and optimally…
Descriptors: Bayesian Statistics, Adaptive Testing, Error of Measurement, Markov Processes
van der Linden, Wim J. – Psychometrika, 2007
Current modeling of response times on test items has been strongly influenced by the paradigm of experimental reaction-time research in psychology. For instance, some of the models have a parameter structure that was chosen to represent a speed-accuracy tradeoff, while others equate speed directly with response time. Also, several response-time…
Descriptors: Test Items, Reaction Time, Markov Processes, Item Response Theory
Glas, Cees A. W.; van der Linden, Wim J. – 2001
In some areas of measurement item parameters should not be modeled as fixed but as random. Examples of such areas are: item sampling, computerized item generation, measurement with substantial estimation error in the item parameter estimates, and grouping of items under a common stimulus or in a common context. A hierarchical version of the…
Descriptors: Bayesian Statistics, Estimation (Mathematics), Item Response Theory, Markov Processes
van der Linden, Wim J. – Journal of Educational and Behavioral Statistics, 2006
A lognormal model for the response times of a person on a set of test items is investigated. The model has a parameter structure analogous to the two-parameter logistic response models in item response theory, with a parameter for the speed of each person as well as parameters for the time intensity and discriminating power of each item. It is…
Descriptors: Test Items, Vocational Aptitude, Reaction Time, Markov Processes