NotesFAQContact Us
Collection
Advanced
Search Tips
Showing all 2 results Save | Export
Peer reviewed Peer reviewed
Luecht, Richard M.; Hirsch, Thomas M. – Applied Psychological Measurement, 1992
Derivations of several item selection algorithms for use in fitting test items to target information functions (IFs) are described. These algorithms, which use an average growth approximation of target IFs, were tested by generating six test forms and were found to provide reliable fit. (SLD)
Descriptors: Algorithms, Computer Assisted Testing, Equations (Mathematics), Goodness of Fit
Luecht, Richard M.; Hirsch, Thomas M. – 1990
The derivation of several item selection algorithms for use in fitting test items to target information functions is described. These algorithms circumvent iterative solutions by using the criteria of moving averages of the distance to a target information function and simultaneously considering an entire range of ability points used to condition…
Descriptors: Ability, Algorithms, College Entrance Examinations, Computer Assisted Testing