Publication Date
In 2025 | 0 |
Since 2024 | 0 |
Since 2021 (last 5 years) | 0 |
Since 2016 (last 10 years) | 0 |
Since 2006 (last 20 years) | 1 |
Descriptor
Goodness of Fit | 16 |
Mathematical Models | 16 |
Test Theory | 16 |
Test Items | 8 |
Latent Trait Theory | 7 |
Item Analysis | 6 |
Scores | 5 |
Factor Analysis | 4 |
Measurement Techniques | 4 |
Multiple Choice Tests | 4 |
Statistical Analysis | 4 |
More ▼ |
Source
Contemporary Educational… | 1 |
Educational and Psychological… | 1 |
Journal of Educational… | 1 |
Journal of Educational… | 1 |
Multivariate Behavioral… | 1 |
Psychometrika | 1 |
Author
Rogers, H. Jane | 2 |
Cohen, Allan S., Comp. | 1 |
Curry, Allen R. | 1 |
Divgi, D. R. | 1 |
Everson, Howard | 1 |
Graham, James M. | 1 |
Hambleton, Ronald K. | 1 |
Hattie, John | 1 |
Hocevar, Dennis | 1 |
Hutchinson, T. P. | 1 |
Jones, Douglas H. | 1 |
More ▼ |
Publication Type
Reports - Research | 13 |
Journal Articles | 6 |
Reports - Evaluative | 2 |
Speeches/Meeting Papers | 2 |
Reference Materials -… | 1 |
Education Level
Audience
Researchers | 2 |
Location
Canada | 1 |
Laws, Policies, & Programs
Elementary and Secondary… | 1 |
Assessments and Surveys
Comprehensive Tests of Basic… | 1 |
Students Evaluation of… | 1 |
What Works Clearinghouse Rating

Masters, Geofferey N. – Psychometrika, 1985
Latent trait and latent class analyses of Likert-type data are compared. Key similarities and differences between these methods are described and illustrated by applying a latent trait model and a latent class model to the analysis of a set of "life satisfaction" data. (Author/NSF)
Descriptors: Attitude Measures, Goodness of Fit, Latent Trait Theory, Mathematical Models

Hattie, John; Rogers, H. Jane – Journal of Educational Psychology, 1986
This article demonstrates that the usual first-order factor model is inappropriate for analyzing the factor structure of creativity and intelligence tests. An alternative model that allows for the estimation of unique covariance between the fluency and originality scores is proposed. (Author/JAZ)
Descriptors: Achievement Tests, Creativity Tests, Factor Analysis, Goodness of Fit
Graham, James M. – Educational and Psychological Measurement, 2006
Coefficient alpha, the most commonly used estimate of internal consistency, is often considered a lower bound estimate of reliability, though the extent of its underestimation is not typically known. Many researchers are unaware that coefficient alpha is based on the essentially tau-equivalent measurement model. It is the violation of the…
Descriptors: Models, Test Theory, Reliability, Structural Equation Models

Divgi, D. R. – Journal of Educational Measurement, 1986
This paper discusses various issues involved in using the Rasch Model with multiple-choice tests and questions the suitability of this model for multiple-choice items. Results of some past studies supporting the model are shown to be irrelevant. The effects of the model's misfit on test equating are demonstrated. (Author JAZ)
Descriptors: Equated Scores, Goodness of Fit, Latent Trait Theory, Mathematical Models

Millsap, Roger E.; Everson, Howard – Multivariate Behavioral Research, 1991
Use of confirmatory factor analysis (CFA) with nonzero latent means in testing six different measurement models from classical test theory is discussed. Implications of the six models for observed mean and covariance structures are described, and three examples of the use of CFA in testing the models are presented. (SLD)
Descriptors: Comparative Analysis, Equations (Mathematics), Goodness of Fit, Mathematical Models

Hutchinson, T. P. – Contemporary Educational Psychology, 1986
Qualitative evidence for the operation of partial knowledge is given by two findings. First, performance when second and subsequent choices are made is above the chance level. Second, it is positively related to first choice performance. A number of theories incorporating partial knowledge are compared quantitatively. (Author/LMO)
Descriptors: Difficulty Level, Feedback, Goodness of Fit, Mathematical Models
Jones, Douglas H. – 1985
The progress of modern mental test theory depends very much on the techniques of maximum likelihood estimation, and many popular applications make use of likelihoods induced by logistic item response models. While, in reality, item responses are nonreplicate within a single examinee and the logistic models are only ideal, practitioners make…
Descriptors: Error Patterns, Functions (Mathematics), Goodness of Fit, Item Analysis
Powell, J. C. – 1980
A multi-faceted model for the selection of answers for multiple-choice tests was developed from the findings of a series of exploratory studies. This model implies that answer selection should be curvilinear. A series of models were tested for fit using the chi square procedure. Data were collected from 359 elementary school students ages 9-12.…
Descriptors: Elementary Education, Foreign Countries, Goodness of Fit, Guessing (Tests)
Yarnold, Paul R.; And Others – 1985
This paper reports on a short version of the Student Jenkins Activity Survey (JAS), a multiple choice questionnaire that measures Type A "coronary-prone" behavior in assessing subjects' A/B types. The primary objective was to determine if the short and long forms of the student JAS represent similar measurement instruments. A secondary…
Descriptors: Behavior Rating Scales, College Students, Comparative Testing, Factor Analysis
Phillips, Gary W. – 1982
This paper presents an introduction to the use of latent trait models for the estimation of domain scores. It was shown that these models provided an advantage over classical test theory and binomial error models in that unbiased estimates of true domain scores could be obtained even when items were not randomly selected from a universe of items.…
Descriptors: Comparative Analysis, Criterion Referenced Tests, Estimation (Mathematics), Goodness of Fit
Curry, Allen R.; And Others – 1978
The efficacy of employing subsets of items from a calibrated item pool to estimate the Rasch model person parameters was investigated. Specifically, the degree of invariance of Rasch model ability-parameter estimates was examined across differing collections of simulated items. The ability-parameter estimates were obtained from a simulation of…
Descriptors: Career Development, Difficulty Level, Equated Scores, Error of Measurement
Yen, Wendy M. – 1979
Three test-analysis models were used to analyze three types of simulated test score data plus the results of eight achievement tests. Chi-square goodness-of-fit statistics were used to evaluate the appropriateness of the models to the four kinds of data. Data were generated to simulate the responses of 1,000 students to 36 pseudo-items by…
Descriptors: Achievement Tests, Correlation, Goodness of Fit, Item Analysis
Marsh, Herbert W.; Hocevar, Dennis – 1986
The advantages of applying confirmatory factor analysis (CFA) to multitrait-multimethod (MTMM) data are widely recognized. However, because CFA as traditionally applied to MTMM data incorporates single indicators of each scale (i.e., each trait/method combination), important weaknesses are the failure to: (1) correct appropriately for measurement…
Descriptors: Computer Software, Construct Validity, Correlation, Error of Measurement
Tatsuoka, Kikumi K.; Tatsuoka, Maurice M. – 1978
The family of Weibull distributions was investigated as a model for the distributions of response times for items in computer-based criterion-referenced tests. The fit of these distributions were, with a few exceptions, good to excellent according to the Kolmogorov-Smirnov test. For a few relatively simple items, the two-parameter gamma…
Descriptors: Career Development, Computer Assisted Instruction, Computer Assisted Testing, Criterion Referenced Tests
Cohen, Allan S., Comp. – 1979
This partially annotated bibliography of journal articles, dissertations, convention papers, research reports, and a few books and unpublished manuscripts provides a comprehensive coverage of work on latent trait theory and practice. Documents are arranged alphabetically by author. The period covered ranges from the early 1950's to the present.…
Descriptors: Attitude Measures, Career Development, Computer Assisted Testing, Computer Programs
Previous Page | Next Page ยป
Pages: 1 | 2