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| Algorithms | 1 |
| Computer Simulation | 1 |
| Item Response Theory | 1 |
| Mathematical Models | 1 |
| Monte Carlo Methods | 1 |
| Power (Statistics) | 1 |
| Psychometrics | 1 |
| Test Construction | 1 |
| Test Length | 1 |
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| Applied Psychological… | 1 |
Author
| Due, Allan M. | 1 |
| Reise, Steven P. | 1 |
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| Journal Articles | 1 |
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Peer reviewedReise, Steven P.; Due, Allan M. – Applied Psychological Measurement, 1991
Previous person-fit research is extended through explication of an unexplored model for generating aberrant response patterns. The proposed model is then implemented to investigate the influence of test properties on the aberrancy detection power of a person-fit statistic. Difficulties of aberrancy detection are discussed. (SLD)
Descriptors: Algorithms, Computer Simulation, Item Response Theory, Mathematical Models
