Publication Date
In 2025 | 0 |
Since 2024 | 0 |
Since 2021 (last 5 years) | 0 |
Since 2016 (last 10 years) | 1 |
Since 2006 (last 20 years) | 2 |
Descriptor
Bayesian Statistics | 3 |
Maximum Likelihood Statistics | 3 |
Comparative Analysis | 2 |
Computation | 2 |
Simulation | 2 |
Test Items | 2 |
Accuracy | 1 |
Adaptive Testing | 1 |
Classification | 1 |
Computer Assisted Testing | 1 |
Difficulty Level | 1 |
More ▼ |
Source
Applied Measurement in… | 3 |
Publication Type
Journal Articles | 3 |
Reports - Research | 2 |
Reports - Evaluative | 1 |
Education Level
Audience
Location
Laws, Policies, & Programs
Assessments and Surveys
What Works Clearinghouse Rating
Koziol, Natalie A. – Applied Measurement in Education, 2016
Testlets, or groups of related items, are commonly included in educational assessments due to their many logistical and conceptual advantages. Despite their advantages, testlets introduce complications into the theory and practice of educational measurement. Responses to items within a testlet tend to be correlated even after controlling for…
Descriptors: Classification, Accuracy, Comparative Analysis, Models
Ho, Tsung-Han; Dodd, Barbara G. – Applied Measurement in Education, 2012
In this study we compared five item selection procedures using three ability estimation methods in the context of a mixed-format adaptive test based on the generalized partial credit model. The item selection procedures used were maximum posterior weighted information, maximum expected information, maximum posterior weighted Kullback-Leibler…
Descriptors: Computer Assisted Testing, Adaptive Testing, Test Items, Selection
Gao, Furong; Chen, Lisue – Applied Measurement in Education, 2005
Through a large-scale simulation study, this article compares item parameter estimates obtained by the marginal maximum likelihood estimation (MMLE) and marginal Bayes modal estimation (MBME) procedures in the 3-parameter logistic model. The impact of different prior specifications on the MBME estimates is also investigated using carefully…
Descriptors: Simulation, Computation, Bayesian Statistics, Item Analysis