Descriptor
Author
Cobern, William W. | 1 |
Connell, Michael L. | 1 |
Hambleton, Ronald K. | 1 |
Levitov, Justin E. | 1 |
Madsen, Harold S. | 1 |
Switzer, Deborah M. | 1 |
Thompson, Bruce | 1 |
Publication Type
Journal Articles | 2 |
Reports - Descriptive | 2 |
Computer Programs | 1 |
Opinion Papers | 1 |
Reports - Evaluative | 1 |
Reports - Research | 1 |
Speeches/Meeting Papers | 1 |
Education Level
Audience
Practitioners | 1 |
Researchers | 1 |
Location
Laws, Policies, & Programs
Assessments and Surveys
What Works Clearinghouse Rating

Hambleton, Ronald K. – Educational Measurement: Issues and Practice, 1984
The purpose of this paper is to describe some of the current changes in test development that are taking place because of the availability and capabilities of computers, especially microcomputers. Item banking and test assembly are discussed, and a comprehensive testing system is described. (BW)
Descriptors: Computer Assisted Testing, Computer Software, Educational Testing, Elementary Secondary Education

Cobern, William W. – 1986
This computer program, written in BASIC, performs three different calculations of test reliability: (1) the Kuder-Richardson method; (2); the "common split-half" method; and (3) the Rulon-Guttman split-half method. The program reads sequential access data files for microcomputers that have been set up by statistical packages such as…
Descriptors: Computer Software, Difficulty Level, Educational Research, Equations (Mathematics)
Madsen, Harold S. – 1986
The most appropriate statistical model for the small-scale (n<100) studies common in language testing research is the Rasch one-parameter logistic model. The Rasch model provides a wide range of options for conducting research, refining existing examinations, and developing tailored (computerized adaptive) language tests. Three investigations…
Descriptors: Computer Assisted Testing, Computer Software, English (Second Language), Item Analysis
Thompson, Bruce; Levitov, Justin E. – Collegiate Microcomputer, 1985
Discusses features of a microcomputer program, SCOREIT, used at New Orleans' Loyola University and several high schools to score and analyze test results. Benefits and dimensions of the program's automated test and item analysis are outlined, and several examples illustrating test and item analyses by SCOREIT are presented. (MBR)
Descriptors: Computer Assisted Testing, Computer Software, Difficulty Level, Higher Education
Switzer, Deborah M.; Connell, Michael L. – 1989
This paper describes teacher usage of the microcomputer programs Test Analysis Package (TAP) and Student Problem Package (SPP) to analyze students' test item responses. These methods of organizing, analyzing, and reporting test results have proven useful to classroom teachers. The TAP consists of four integrated microcomputer programs to edit,…
Descriptors: Academic Achievement, Computer Assisted Testing, Computer Managed Instruction, Computer Software