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Huang, Hung-Yu; Wang, Wen-Chung – Educational and Psychological Measurement, 2013
Both testlet design and hierarchical latent traits are fairly common in educational and psychological measurements. This study aimed to develop a new class of higher order testlet response models that consider both local item dependence within testlets and a hierarchy of latent traits. Due to high dimensionality, the authors adopted the Bayesian…
Descriptors: Item Response Theory, Models, Bayesian Statistics, Computation
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Cahan, Sorel; Cohen, Nora – Educational and Psychological Measurement, 1990
A solution is offered to problems associated with the inequality in the manipulability of probabilities of classification errors of masters versus nonmasters, based on competency test results. Eschewing the typical arbitrary establishment of observed-score standards below 100 percent, the solution incorporates a self-correction of wrong answers.…
Descriptors: Classification, Error of Measurement, Mastery Tests, Minimum Competency Testing
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Smith, Malbert, III; And Others – Educational and Psychological Measurement, 1982
The degree to which it is possible to identify, from data in their cumulative folders, students likely to fail a high school competency test is investigated. Results indicated that some predictor variables could be used to identify those likely to fail Senior High Assessment of Reading Progress and the Test of Proficiency in Computational Skills.…
Descriptors: Academic Achievement, Academic Failure, Educational Diagnosis, Mathematics Achievement
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Halpin, Gerald; And Others – Educational and Psychological Measurement, 1983
Although arbitrary, whenever multiple judgmental standard-setting procedures are utilized by different groups concurrently, stability across raters can be achieved and decisions can be made in a relatively judicious manner. Greater stability across methods (Ebel, Nedelsky, Angoff) may be effected by slightly modifying the Ebel approach. (Author/PN)
Descriptors: Admission Criteria, College Entrance Examinations, Cutting Scores, Higher Education
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Plake, Barbara S.; Melican, Gerald J. – Educational and Psychological Measurement, 1989
The impact of overall test length and difficulty on the expert judgments of item performance by the Nedelsky method were studied. Five university-level instructors predicting the performance of minimally competent candidates on a mathematics examination were fairly consistent in their assessments regardless of length or difficulty of the test.…
Descriptors: Difficulty Level, Estimation (Mathematics), Evaluators, Higher Education