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Lee, Ju Hyun – 1995
This paper presents an information processing model of test anxiety in an attempt to explain the mechanism of test anxiety's effect on working memory within the framework of the American College Testing Program Assessment (ACT). The model suggests that the construct of test anxiety, both worry and emotionality, is represented in the declarative…
Descriptors: Cognitive Processes, College Entrance Examinations, College Students, Emotional Response