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Zhou, Todd; Jiao, Hong – Educational and Psychological Measurement, 2023
Cheating detection in large-scale assessment received considerable attention in the extant literature. However, none of the previous studies in this line of research investigated the stacking ensemble machine learning algorithm for cheating detection. Furthermore, no study addressed the issue of class imbalance using resampling. This study…
Descriptors: Cheating, Measurement, Artificial Intelligence, Algorithms
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Gonzalez, Oscar – Educational and Psychological Measurement, 2023
When scores are used to make decisions about respondents, it is of interest to estimate classification accuracy (CA), the probability of making a correct decision, and classification consistency (CC), the probability of making the same decision across two parallel administrations of the measure. Model-based estimates of CA and CC computed from the…
Descriptors: Classification, Accuracy, Intervals, Probability
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Lee, Sooyong; Han, Suhwa; Choi, Seung W. – Educational and Psychological Measurement, 2022
Response data containing an excessive number of zeros are referred to as zero-inflated data. When differential item functioning (DIF) detection is of interest, zero-inflation can attenuate DIF effects in the total sample and lead to underdetection of DIF items. The current study presents a DIF detection procedure for response data with excess…
Descriptors: Test Bias, Monte Carlo Methods, Simulation, Models
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Hecht, Martin; Weirich, Sebastian; Siegle, Thilo; Frey, Andreas – Educational and Psychological Measurement, 2015
Multiple matrix designs are commonly used in large-scale assessments to distribute test items to students. These designs comprise several booklets, each containing a subset of the complete item pool. Besides reducing the test burden of individual students, using various booklets allows aligning the difficulty of the presented items to the assumed…
Descriptors: Measurement, Item Sampling, Statistical Analysis, Models
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Straat, J. Hendrik; van der Ark, L. Andries; Sijtsma, Klaas – Educational and Psychological Measurement, 2014
An automated item selection procedure in Mokken scale analysis partitions a set of items into one or more Mokken scales, if the data allow. Two algorithms are available that pursue the same goal of selecting Mokken scales of maximum length: Mokken's original automated item selection procedure (AISP) and a genetic algorithm (GA). Minimum…
Descriptors: Sampling, Test Items, Effect Size, Scaling
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Dumenci, Levent; Yates, Phillip D. – Educational and Psychological Measurement, 2012
Estimation problems associated with the correlated-trait correlated-method (CTCM) parameterization of a multitrait-multimethod (MTMM) matrix are widely documented: the model often fails to converge; even when convergence is achieved, one or more of the parameter estimates are outside the admissible parameter space. In this study, the authors…
Descriptors: Correlation, Models, Multitrait Multimethod Techniques, Matrices
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Zhang, Bo; Stone, Clement A. – Educational and Psychological Measurement, 2008
This research examines the utility of the s-x[superscript 2] statistic proposed by Orlando and Thissen (2000) in evaluating item fit for multidimensional item response models. Monte Carlo simulation was conducted to investigate both the Type I error and statistical power of this fit statistic in analyzing two kinds of multidimensional test…
Descriptors: Monte Carlo Methods, Sampling, Goodness of Fit, Evaluation Methods
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Schumacker, Randall E.; Smith, Everett V., Jr. – Educational and Psychological Measurement, 2007
Measurement error is a common theme in classical measurement models used in testing and assessment. In classical measurement models, the definition of measurement error and the subsequent reliability coefficients differ on the basis of the test administration design. Internal consistency reliability specifies error due primarily to poor item…
Descriptors: Measurement Techniques, Error of Measurement, Item Sampling, Item Response Theory
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Barchard, Kimberly A.; Hakstian, A. Ralph – Educational and Psychological Measurement, 1997
The distinction between Type 1 and Type 12 sampling in connection with measurement data is discussed, and a method is presented for simulating data arising from Type 12 sampling. A Monte Carlo study is described that shows conditions under which precise confidence level control under Type 12 sampling is maintained. (SLD)
Descriptors: Models, Monte Carlo Methods, Sampling, Simulation
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Bolding, James T. – Educational and Psychological Measurement, 1972
Descriptors: Computer Programs, Data Processing, Models, Multiple Regression Analysis
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Brandenburg, Dale C.; Forsyth, Robert A. – Educational and Psychological Measurement, 1974
Descriptors: Comparative Analysis, Goodness of Fit, Item Sampling, Models
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Poggio, John P.; Glasnapp, Douglas R. – Educational and Psychological Measurement, 1973
Descriptors: Academic Achievement, Evaluation Methods, Formative Evaluation, Item Sampling