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Patel, Nirmal; Sharma, Aditya; Shah, Tirth; Lomas, Derek – Journal of Educational Data Mining, 2021
Process Analysis is an emerging approach to discover meaningful knowledge from temporal educational data. The study presented in this paper shows how we used Process Analysis methods on the National Assessment of Educational Progress (NAEP) test data for modeling and predicting student test-taking behavior. Our process-oriented data exploration…
Descriptors: Learning Analytics, National Competency Tests, Evaluation Methods, Prediction
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Wang, Shiyu; Yang, Yan; Culpepper, Steven Andrew; Douglas, Jeffrey A. – Journal of Educational and Behavioral Statistics, 2018
A family of learning models that integrates a cognitive diagnostic model and a higher-order, hidden Markov model in one framework is proposed. This new framework includes covariates to model skill transition in the learning environment. A Bayesian formulation is adopted to estimate parameters from a learning model. The developed methods are…
Descriptors: Skill Development, Cognitive Measurement, Cognitive Processes, Markov Processes
Geigle, Chase – ProQuest LLC, 2018
There are two primary challenges for instructors in offering a high-quality course at large scale. The first is scaling educational experiences to such a large audience. The second major challenge encountered is that of enabling adaptivity of the educational experience. This thesis addresses both major challenges in the way of high-quality…
Descriptors: Barriers, Educational Quality, Computer Assisted Testing, Educational Experience
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Wang, Chun; Fan, Zhewen; Chang, Hua-Hua; Douglas, Jeffrey A. – Journal of Educational and Behavioral Statistics, 2013
The item response times (RTs) collected from computerized testing represent an underutilized type of information about items and examinees. In addition to knowing the examinees' responses to each item, we can investigate the amount of time examinees spend on each item. Current models for RTs mainly focus on parametric models, which have the…
Descriptors: Reaction Time, Computer Assisted Testing, Test Items, Accuracy
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Feng, Mingyu, Ed.; Käser, Tanja, Ed.; Talukdar, Partha, Ed. – International Educational Data Mining Society, 2023
The Indian Institute of Science is proud to host the fully in-person sixteenth iteration of the International Conference on Educational Data Mining (EDM) during July 11-14, 2023. EDM is the annual flagship conference of the International Educational Data Mining Society. The theme of this year's conference is "Educational data mining for…
Descriptors: Information Retrieval, Data Analysis, Computer Assisted Testing, Cheating
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Klein Entink, Rinke H.; Kuhn, Jorg-Tobias; Hornke, Lutz F.; Fox, Jean-Paul – Psychological Methods, 2009
In current psychological research, the analysis of data from computer-based assessments or experiments is often confined to accuracy scores. Response times, although being an important source of additional information, are either neglected or analyzed separately. In this article, a new model is developed that allows the simultaneous analysis of…
Descriptors: Psychological Studies, Monte Carlo Methods, Markov Processes, Educational Assessment
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von Davier, Matthias – ETS Research Report Series, 2005
Probabilistic models with more than one latent variable are designed to report profiles of skills or cognitive attributes. Testing programs want to offer additional information beyond what a single test score can provide using these skill profiles. Many recent approaches to skill profile models are limited to dichotomous data and have made use of…
Descriptors: Models, Diagnostic Tests, Language Tests, Language Proficiency