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Download full textFeng, Mingyu, Ed.; Käser, Tanja, Ed.; Talukdar, Partha, Ed. – International Educational Data Mining Society, 2023
The Indian Institute of Science is proud to host the fully in-person sixteenth iteration of the International Conference on Educational Data Mining (EDM) during July 11-14, 2023. EDM is the annual flagship conference of the International Educational Data Mining Society. The theme of this year's conference is "Educational data mining for…
Descriptors: Information Retrieval, Data Analysis, Computer Assisted Testing, Cheating
An Optimization Model for Test Assembly To Match Observed-Score Distributions. Research Report 94-7.
van der Linden, Wim J.; Luecht, Richard M. – 1994
An optimization model is presented that allows test assemblers to control the shape of the observed-score distribution on a test for a population with a known ability distribution. An obvious application is for item response theory-based test assembly in programs where observed scores are reported and operational test forms are required to produce…
Descriptors: Ability, Foreign Countries, Heuristics, Item Response Theory
