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Tong, Xin; Zhang, Zhiyong – Grantee Submission, 2020
Despite broad applications of growth curve models, few studies have dealt with a practical issue -- nonnormality of data. Previous studies have used Student's "t" distributions to remedy the nonnormal problems. In this study, robust distributional growth curve models are proposed from a semiparametric Bayesian perspective, in which…
Descriptors: Robustness (Statistics), Bayesian Statistics, Models, Error of Measurement
Martínez Abad, Fernando; Chaparro Caso López, Alicia A. – School Effectiveness and School Improvement, 2017
In light of the emergence of statistical analysis techniques based on data mining in education sciences, and the potential they offer to detect non-trivial information in large databases, this paper presents a procedure used to detect factors linked to academic achievement in large-scale assessments. The study is based on a non-experimental,…
Descriptors: Foreign Countries, Data Collection, Statistical Analysis, Evaluation Methods
Paek, Insu; Park, Hyun-Jeong; Cai, Li; Chi, Eunlim – Educational and Psychological Measurement, 2014
Typically a longitudinal growth modeling based on item response theory (IRT) requires repeated measures data from a single group with the same test design. If operational or item exposure problems are present, the same test may not be employed to collect data for longitudinal analyses and tests at multiple time points are constructed with unique…
Descriptors: Item Response Theory, Comparative Analysis, Test Items, Equated Scores
von Davier, Matthias; Xu, Xueli; Carstensen, Claus H. – Educational Testing Service, 2009
A general diagnostic model was used to specify and compare two multidimensional item-response-theory (MIRT) models for longitudinal data: (a) a model that handles repeated measurements as multiple, correlated variables over time (Andersen, 1985) and (b) a model that assumes one common variable over time and additional orthogonal variables that…
Descriptors: Models, Item Response Theory, Longitudinal Studies, Measurement
An Optimization Model for Test Assembly To Match Observed-Score Distributions. Research Report 94-7.
van der Linden, Wim J.; Luecht, Richard M. – 1994
An optimization model is presented that allows test assemblers to control the shape of the observed-score distribution on a test for a population with a known ability distribution. An obvious application is for item response theory-based test assembly in programs where observed scores are reported and operational test forms are required to produce…
Descriptors: Ability, Foreign Countries, Heuristics, Item Response Theory