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Straat, J. Hendrik; van der Ark, L. Andries; Sijtsma, Klaas – Educational and Psychological Measurement, 2014
An automated item selection procedure in Mokken scale analysis partitions a set of items into one or more Mokken scales, if the data allow. Two algorithms are available that pursue the same goal of selecting Mokken scales of maximum length: Mokken's original automated item selection procedure (AISP) and a genetic algorithm (GA). Minimum…
Descriptors: Sampling, Test Items, Effect Size, Scaling
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Oranje, Andreas; Li, Deping; Kandathil, Mathew – ETS Research Report Series, 2009
Several complex sample standard error estimators based on linearization and resampling for the latent regression model of the National Assessment of Educational Progress (NAEP) are studied with respect to design choices such as number of items, number of regressors, and the efficiency of the sample. This paper provides an evaluation of the extent…
Descriptors: Error of Measurement, Computation, Regression (Statistics), National Competency Tests