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Harring, Jeffrey R.; Johnson, Tessa L. – Educational Measurement: Issues and Practice, 2020
In this digital ITEMS module, Dr. Jeffrey Harring and Ms. Tessa Johnson introduce the linear mixed effects (LME) model as a flexible general framework for simultaneously modeling continuous repeated measures data with a scientifically defensible function that adequately summarizes both individual change as well as the average response. The module…
Descriptors: Educational Assessment, Data Analysis, Longitudinal Studies, Case Studies
Ehara, Yo – International Educational Data Mining Society, 2022
Language learners are underserved if there are unlearned meanings of a word that they think they have already learned. For example, "circle" as a noun is well known, whereas its use as a verb is not. For artificial-intelligence-based support systems for learning vocabulary, assessing each learner's knowledge of such atypical but common…
Descriptors: Language Tests, Vocabulary Development, Second Language Learning, Second Language Instruction
Geerlings, Hanneke; van der Linden, Wim J.; Glas, Cees A. W. – Applied Psychological Measurement, 2013
Optimal test-design methods are applied to rule-based item generation. Three different cases of automated test design are presented: (a) test assembly from a pool of pregenerated, calibrated items; (b) test generation on the fly from a pool of calibrated item families; and (c) test generation on the fly directly from calibrated features defining…
Descriptors: Test Construction, Test Items, Item Banks, Automation
Feng, Mingyu, Ed.; Käser, Tanja, Ed.; Talukdar, Partha, Ed. – International Educational Data Mining Society, 2023
The Indian Institute of Science is proud to host the fully in-person sixteenth iteration of the International Conference on Educational Data Mining (EDM) during July 11-14, 2023. EDM is the annual flagship conference of the International Educational Data Mining Society. The theme of this year's conference is "Educational data mining for…
Descriptors: Information Retrieval, Data Analysis, Computer Assisted Testing, Cheating
Gierl, Mark J.; Lai, Hollis – International Journal of Testing, 2012
Automatic item generation represents a relatively new but rapidly evolving research area where cognitive and psychometric theories are used to produce tests that include items generated using computer technology. Automatic item generation requires two steps. First, test development specialists create item models, which are comparable to templates…
Descriptors: Foreign Countries, Psychometrics, Test Construction, Test Items
Rupp, Andre A. – International Journal of Testing, 2003
Item response theory (IRT) has become one of the most popular scoring frameworks for measurement data. IRT models are used frequently in computerized adaptive testing, cognitively diagnostic assessment, and test equating. This article reviews two of the most popular software packages for IRT model estimation, BILOG-MG (Zimowski, Muraki, Mislevy, &…
Descriptors: Test Items, Adaptive Testing, Item Response Theory, Computer Software
van der Linden, Wim J.; Scrams, David J.; Schnipke, Deborah L. – 1998
An item-selection algorithm to neutralize the differential effects of time limits on scores on computerized adaptive tests is proposed. The method is based on a statistical model for the response-time distributions of the examinees on items in the pool that is updated each time a new item has been administered. Predictions from the model are used…
Descriptors: Adaptive Testing, Algorithms, Computer Assisted Testing, Foreign Countries
Pechenizkiy, Mykola; Calders, Toon; Conati, Cristina; Ventura, Sebastian; Romero, Cristobal; Stamper, John – International Working Group on Educational Data Mining, 2011
The 4th International Conference on Educational Data Mining (EDM 2011) brings together researchers from computer science, education, psychology, psychometrics, and statistics to analyze large datasets to answer educational research questions. The conference, held in Eindhoven, The Netherlands, July 6-9, 2011, follows the three previous editions…
Descriptors: Academic Achievement, Logical Thinking, Profiles, Tutoring

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