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A Reformulated Correlated Trait-Correlated Method Model for Multitrait-Multimethod Data Effectively Increases Convergence and Admissibility Rates
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Fan, Yi; Lance, Charles E. – Educational and Psychological Measurement, 2017
The correlated trait-correlated method (CTCM) model for the analysis of multitrait-multimethod (MTMM) data is known to suffer convergence and admissibility (C&A) problems. We describe a little known and seldom applied reparameterized version of this model (CTCM-R) based on Rindskopf's reparameterization of the simpler confirmatory factor…
Descriptors: Multitrait Multimethod Techniques, Correlation, Goodness of Fit, Models
Convergence, Admissibility, and Fit of Alternative Confirmatory Factor Analysis Models for MTMM Data
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Lance, Charles E.; Fan, Yi – Educational and Psychological Measurement, 2016
We compared six different analytic models for multitrait-multimethod (MTMM) data in terms of convergence, admissibility, and model fit to 258 samples of previously reported data. Two well-known models, the correlated trait-correlated method (CTCM) and the correlated trait-correlated uniqueness (CTCU) models, were fit for reference purposes in…
Descriptors: Multitrait Multimethod Techniques, Factor Analysis, Models, Goodness of Fit