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Fan, Yi; Lance, Charles E. – Educational and Psychological Measurement, 2017
The correlated trait-correlated method (CTCM) model for the analysis of multitrait-multimethod (MTMM) data is known to suffer convergence and admissibility (C&A) problems. We describe a little known and seldom applied reparameterized version of this model (CTCM-R) based on Rindskopf's reparameterization of the simpler confirmatory factor…
Descriptors: Multitrait Multimethod Techniques, Correlation, Goodness of Fit, Models
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Lance, Charles E.; Fan, Yi – Educational and Psychological Measurement, 2016
We compared six different analytic models for multitrait-multimethod (MTMM) data in terms of convergence, admissibility, and model fit to 258 samples of previously reported data. Two well-known models, the correlated trait-correlated method (CTCM) and the correlated trait-correlated uniqueness (CTCU) models, were fit for reference purposes in…
Descriptors: Multitrait Multimethod Techniques, Factor Analysis, Models, Goodness of Fit
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Conway, James M.; Lievens, Filip; Scullen, Steven E.; Lance, Charles E. – Structural Equation Modeling, 2004
This simulation investigates bias in trait factor loadings and intercorrelations when analyzing multitrait-multimethod (MTMM) data using the correlated uniqueness (CU) confirmatory factor analysis (CFA) model. A theoretical weakness of the CU model is the assumption of uncorrelated methods. However, previous simulation studies have shown little…
Descriptors: Multitrait Multimethod Techniques, Factor Analysis, Factor Structure, Simulation