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Shun-Fu Hu; Amery D. Wu; Jake Stone – Journal of Educational Measurement, 2025
Scoring high-dimensional assessments (e.g., > 15 traits) can be a challenging task. This paper introduces the multilabel neural network (MNN) as a scoring method for high-dimensional assessments. Additionally, it demonstrates how MNN can score the same test responses to maximize different performance metrics, such as accuracy, recall, or…
Descriptors: Tests, Testing, Scores, Test Construction