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Applied Psychological… | 4 |
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Bagozzi, Richard P. | 1 |
Brannick, Michael T. | 1 |
Marsh, Herbert W. | 1 |
Schweizer, Karl | 1 |
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Yi, Youjae | 1 |
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Schweizer, Karl – Applied Psychological Measurement, 1991
An equal-level approach is proposed for investigating multitrait-multimethod (MTMM) matrices with respect to other organizational units that contain additional information concerning a MTMM matrix's validity. The approach requires equality in "data level" before coefficients are submitted for evaluation. Disaggregation is central to…
Descriptors: Comparative Analysis, Correlation, Equations (Mathematics), Mathematical Models

Brannick, Michael T.; Spector, Paul E. – Applied Psychological Measurement, 1990
Applications of the confirmatory factor analysis block-diagonal model to published data on 18 multitrait-multimethod matrices were reviewed to show widespread estimation problems. Possible causes of estimation difficulties were explored using computer simulations. These problems make the block-diagonal approach less useful than has generally been…
Descriptors: Estimation (Mathematics), Mathematical Models, Matrices, Multitrait Multimethod Techniques

Marsh, Herbert W. – Applied Psychological Measurement, 1989
Three multitrait-multimethod studies are described, which indicated that ill-defined solutions were frequent, and alternative parameterizations tended only to mask this problem. Moreover, method factors sometimes represented trait variance as opposed to method variance. However, specification of method effects as correlated uniqueness proved more…
Descriptors: Construct Validity, Factor Analysis, Methods Research, Multitrait Multimethod Techniques

Bagozzi, Richard P.; Yi, Youjae – Applied Psychological Measurement, 1992
Research on the direct-product model is extended by deriving hierarchically nested models for explicitly testing the patterns of method and trait factors and through formal tests developed for the pattern of communalities. These procedures are illustrated, and use of the MUTMUM computer program is discussed. (SLD)
Descriptors: Construct Validity, Equations (Mathematics), Estimation (Mathematics), Hypothesis Testing