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Guo, Hongwen; Zu, Jiyun; Kyllonen, Patrick; Schmitt, Neal – ETS Research Report Series, 2016
In this report, systematic applications of statistical and psychometric methods are used to develop and evaluate scoring rules in terms of test reliability. Data collected from a situational judgment test are used to facilitate the comparison. For a well-developed item with appropriate keys (i.e., the correct answers), agreement among various…
Descriptors: Scoring, Test Reliability, Statistical Analysis, Psychometrics
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Guo, Hongwen; Rios, Joseph A.; Haberman, Shelby; Liu, Ou Lydia; Wang, Jing; Paek, Insu – Applied Measurement in Education, 2016
Unmotivated test takers using rapid guessing in item responses can affect validity studies and teacher and institution performance evaluation negatively, making it critical to identify these test takers. The authors propose a new nonparametric method for finding response-time thresholds for flagging item responses that result from rapid-guessing…
Descriptors: Guessing (Tests), Reaction Time, Nonparametric Statistics, Models
Guo, Hongwen; Sinharay, Sandip – Educational Testing Service, 2011
Nonparametric, or kernel, estimation of item response curve (IRC) is a concern theoretically and operationally. Accuracy of this estimation, often used in item analysis in testing programs, is biased when the observed scores are used as the regressor because the observed scores are contaminated by measurement error. In this study, we investigate…
Descriptors: Error of Measurement, Nonparametric Statistics, Item Response Theory, Computation
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Guo, Hongwen; Sinharay, Sandip – Journal of Educational and Behavioral Statistics, 2011
Nonparametric or kernel regression estimation of item response curves (IRCs) is often used in item analysis in testing programs. These estimates are biased when the observed scores are used as the regressor because the observed scores are contaminated by measurement error. Accuracy of this estimation is a concern theoretically and operationally.…
Descriptors: Testing Programs, Measurement, Item Analysis, Error of Measurement