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van der Linden, Wim J. – Journal of Educational and Behavioral Statistics, 2022
The current literature on test equating generally defines it as the process necessary to obtain score comparability between different test forms. The definition is in contrast with Lord's foundational paper which viewed equating as the process required to obtain comparability of measurement scale between forms. The distinction between the notions…
Descriptors: Equated Scores, Test Items, Scores, Probability
van der Linden, Wim J. – Applied Psychological Measurement, 2011
It is shown how the time limit on a test can be set to control the probability of a test taker running out of time before completing it. The probability is derived from the item parameters in the lognormal model for response times. Examples of curves representing the probability of running out of time on a test with given parameters as a function…
Descriptors: Testing, Timed Tests, Models, Probability
van der Linden, Wim J.; Jeon, Minjeong – Journal of Educational and Behavioral Statistics, 2012
The probability of test takers changing answers upon review of their initial choices is modeled. The primary purpose of the model is to check erasures on answer sheets recorded by an optical scanner for numbers and patterns that may be indicative of irregular behavior, such as teachers or school administrators changing answer sheets after their…
Descriptors: Probability, Models, Test Items, Educational Testing
van der Linden, Wim J.; Veldkamp, Bernard P. – Journal of Educational and Behavioral Statistics, 2007
Two conditional versions of the exposure-control method with item-ineligibility constraints for adaptive testing in van der Linden and Veldkamp (2004) are presented. The first version is for unconstrained item selection, the second for item selection with content constraints imposed by the shadow-test approach. In both versions, the exposure rates…
Descriptors: Law Schools, Adaptive Testing, Item Analysis, Probability
van der Linden, Wim J.; Vos, Hans J.; Chang, Lei – 2000
In judgmental standard setting experiments, it may be difficult to specify subjective probabilities that adequately take the properties of the items into account. As a result, these probabilities are not consistent with each other in the sense that they do not refer to the same borderline level of performance. Methods to check standard setting…
Descriptors: Interrater Reliability, Judges, Probability, Standard Setting

van der Linden, Wim J.; Mellenbergh, Gideon J. – 1977
From a decision theoretic viewpoint, a general coefficient (delta) for tests is derived. The coefficient is applied to three kinds of decision situations. The first situation involves a true score estimated by a function of the observed score of a subject on a test (point estimation). Using the squared error loss function and Kelley's formula for…
Descriptors: Decision Making, Equations (Mathematics), Estimation (Mathematics), Probability
van der Linden, Wim J.; Veldkamp, Bernard P. – Journal of Educational and Behavioral Statistics, 2004
Item-exposure control in computerized adaptive testing is implemented by imposing item-ineligibility constraints on the assembly process of the shadow tests. The method resembles Sympson and Hetter's (1985) method of item-exposure control in that the decisions to impose the constraints are probabilistic. The method does not, however, require…
Descriptors: Probability, Law Schools, Admission (School), Adaptive Testing
van der Linden, Wim J. – 2002
The Sympson and Hetter (SH; J. Sympson and R. Hetter; 1985; 1997) method is a method of probabilistic item exposure control in computerized adaptive testing. Setting its control parameters to admissible values requires an iterative process of computer simulations that has been found to be time consuming, particularly if the parameters have to be…
Descriptors: Adaptive Testing, College Entrance Examinations, Computer Assisted Testing, Law Schools
van der Linden, Wim J.; Veldkamp, Bernard P. – 2002
Item-exposure control in computerized adaptive testing is implemented by imposing item-ineligibility constraints on the assembly process of the shadow tests. The method resembles J. Sympson and R. Hetter's (1985) method of item-exposure control in that the decisions to impose the constraints are probabilistic. However, the method does not require…
Descriptors: Adaptive Testing, College Entrance Examinations, Computer Assisted Testing, Law Schools
van der Linden, Wim J. – 1981
It has often been argued that all techniques of standard setting are arbitrary and likely to yield different results for different techniques or persons. This paper deals with a related but hitherto ignored aspect of standard setting, namely, the possibility that Angoff or Nedelsky judges misspecify the probabilities of the borderline student's…
Descriptors: Error of Measurement, Evaluators, Foreign Countries, Latent Trait Theory

van der Linden, Wim J. – Applied Psychological Measurement, 1979
The restrictions on item difficulties that must be met when binomial models are applied to domain-referenced testing are examined. Both a deterministic and a stochastic conception of item responses are discussed with respect to difficulty and Guttman-type items. (Author/BH)
Descriptors: Difficulty Level, Item Sampling, Latent Trait Theory, Mathematical Models

van der Linden, Wim J. – Journal of Educational Statistics, 1978
Macready and Dayton introduced two probabilistic models for mastery assessment based on an idealistic all-or-none conception of mastery. Alternatively, an application of latent trait theory to mastery testing is proposed (a three parameter logistic model) as a more plausible model for test theory. (Author/CTM)
Descriptors: Criterion Referenced Tests, Guessing (Tests), Item Analysis, Latent Trait Theory
van der Linden, Wim J. – 1980
Latent class models for mastery testing differ from continuum models in that they do not postulate a latent mastery continuum but conceive mastery and non-mastery as two latent classes, each characterized by different probabilities of success. Several researchers use a simple latent class model that is basically a simultaneous application of the…
Descriptors: Cutting Scores, Error Patterns, Estimation (Mathematics), Foreign Countries
van der Linden, Wim J. – 1982
A latent trait method is presented to investigate the possibility that Angoff or Nedelsky judges specify inconsistent probabilities in standard setting techniques for objectives-based instructional programs. It is suggested that judges frequently specify a low probability of success for an easy item but a large probability for a hard item. The…
Descriptors: Criterion Referenced Tests, Cutting Scores, Error of Measurement, Interrater Reliability