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Direct linkDardick, William R.; Mislevy, Robert J. – Educational and Psychological Measurement, 2016
A new variant of the iterative "data = fit + residual" data-analytical approach described by Mosteller and Tukey is proposed and implemented in the context of item response theory psychometric models. Posterior probabilities from a Bayesian mixture model of a Rasch item response theory model and an unscalable latent class are expressed…
Descriptors: Bayesian Statistics, Probability, Data Analysis, Item Response Theory
Sinharay, Sandip; Johnson, Matthew S.; Williamson, David M. – Journal of Educational and Behavioral Statistics, 2003
Item families, which are groups of related items, are becoming increasingly popular in complex educational assessments. For example, in automatic item generation (AIG) systems, a test may consist of multiple items generated from each of a number of item models. Item calibration or scoring for such an assessment requires fitting models that can…
Descriptors: Test Items, Markov Processes, Educational Testing, Probability
