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Item Order and Speededness: Implications for Test Fairness in Higher Educational High-Stakes Testing
Becker, Benjamin; van Rijn, Peter; Molenaar, Dylan; Debeer, Dries – Assessment & Evaluation in Higher Education, 2022
A common approach to increase test security in higher educational high-stakes testing is the use of different test forms with identical items but different item orders. The effects of such varied item orders are relatively well studied, but findings have generally been mixed. When multiple test forms with different item orders are used, we argue…
Descriptors: Information Security, High Stakes Tests, Computer Security, Test Items
Schmitz, Florian; Wilhelm, Oliver – Measurement: Interdisciplinary Research and Perspectives, 2015
The excellent paper by Goldhammer (this issue) deals with a most relevant and very pervasive problem of ability assessment: the evaluation of performance by considering speed and accuracy of performance. Goldhammer proposes item-level time limits as a possible remedy for individual differences in the speed-accuracy trade-off (SATO) to keep time…
Descriptors: Ability, Reaction Time, Accuracy, Performance
Jansen, Margo G. H. – Journal of Educational and Behavioral Statistics, 2007
The author considers a latent trait model for the response time on a (set of) pure speed test(s), the multiplicative gamma model (MGM), which is based on the assumption that the test response times are approximately gamma distributed, with known index parameters and scale parameters depending on subject ability and test difficulty parameters. Like…
Descriptors: Reaction Time, Timed Tests, Item Response Theory, Models
Jansen, M. G. H.; Glas, C. A. W. – Psychometrika, 2005
Two new tests for a model for the response times on pure speed tests by Rasch (1960) are proposed. The model is based on the assumption that the test response times are approximately gamma distributed, with known index parameters and unknown rate parameters. The rate parameters are decomposed in a subject ability parameter and a test difficulty…
Descriptors: Timed Tests, Reaction Time, Models, Difficulty Level