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Direct linkKim, Jihye; Oshima, T. C. – Educational and Psychological Measurement, 2013
In a typical differential item functioning (DIF) analysis, a significance test is conducted for each item. As a test consists of multiple items, such multiple testing may increase the possibility of making a Type I error at least once. The goal of this study was to investigate how to control a Type I error rate and power using adjustment…
Descriptors: Test Bias, Test Items, Statistical Analysis, Error of Measurement
Rutkowski, Leslie – Applied Measurement in Education, 2014
Large-scale assessment programs such as the National Assessment of Educational Progress (NAEP), Trends in International Mathematics and Science Study (TIMSS), and Programme for International Student Assessment (PISA) use a sophisticated assessment administration design called matrix sampling that minimizes the testing burden on individual…
Descriptors: Measurement, Testing, Item Sampling, Computation
