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Williams, Thomas O., Jr.; Fall, Anna-Maria; Eaves, Ronald C.; Darch, Craig; Woods-Groves, Suzanne – Assessment for Effective Intervention, 2007
The factor structure of the "KeyMath--Revised Normative Update" (KMR-NU) "Form A" was analyzed using data from a sample of 130 students. The KMR-NU is composed of 13 subtests that are purported to measure three important aspects of math ability: Basic Concepts, Operations, and Applications. A confirmatory factor analysis…
Descriptors: Mathematical Models, Goodness of Fit, Academic Ability, Mathematics
Mare, Robert D.; Mason, William M. – 1978
An important class of applications of measurement error or constrained factor analytic models consists of comparing models for several populations. In such cases, it is appropriate to make explicit statistical tests of model similarity across groups and to constrain some parameters of the models to be equal across groups using a priori substantive…
Descriptors: Factor Analysis, Goodness of Fit, Information Sources, Mathematical Models
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Hanson, Bradley A.; Brennan, Robert L. – Journal of Educational Measurement, 1990
Using several data sets, the relative performance of the beta binomial model and two more general strong true score models in estimating several indices of classification consistency is examined. It appears that the beta binomial model can provide inadequate fits to raw score distributions compared to more general models. (TJH)
Descriptors: Classification, Comparative Analysis, Equations (Mathematics), Estimation (Mathematics)
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Graham, James M. – Educational and Psychological Measurement, 2006
Coefficient alpha, the most commonly used estimate of internal consistency, is often considered a lower bound estimate of reliability, though the extent of its underestimation is not typically known. Many researchers are unaware that coefficient alpha is based on the essentially tau-equivalent measurement model. It is the violation of the…
Descriptors: Models, Test Theory, Reliability, Structural Equation Models
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Rogosa, David; Willett, John B. – Journal of Educational Statistics, 1985
A five by five covariance matrix representing longitudinal measurements at five occasions is used to illustrate that markedly different types of learning curves may generate indistinguishable covariance structures. An excellent fit of a simplex structure can be misleading. Common uses of covariance structure models for growth studies are…
Descriptors: Analysis of Covariance, Goodness of Fit, Hypothesis Testing, Longitudinal Studies
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Tucker, Ledyard R.; Lewis, Charles – Psychometrika, 1973
Maximum likelihood factor analysis provides an effective method for estimation of factor matrices and a useful test statistic in the likelihood ratio for rejection of overly simple factor models. A reliability coefficient is proposed for analysis of factor solution. (Author/RK)
Descriptors: Analysis of Variance, Factor Analysis, Goodness of Fit, Item Sampling
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Reddy, Srinivas K. – Educational and Psychological Measurement, 1992
Implications of ignoring correlated error on parameter estimates in some simple structural equation models are examined. It is shown analytically and empirically through simulation that ignoring positive between-construct correlated error overestimates the structural parameter linking the two constructs. Effects become more pronounced with…
Descriptors: Correlation, Equations (Mathematics), Error of Measurement, Estimation (Mathematics)
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Luecht, Richard M.; Hirsch, Thomas M. – Applied Psychological Measurement, 1992
Derivations of several item selection algorithms for use in fitting test items to target information functions (IFs) are described. These algorithms, which use an average growth approximation of target IFs, were tested by generating six test forms and were found to provide reliable fit. (SLD)
Descriptors: Algorithms, Computer Assisted Testing, Equations (Mathematics), Goodness of Fit
Reckase, Mark D. – 1978
Five comparisons were made relative to the quality of estimates of ability parameters and item calibrations obtained from the one-parameter and three-parameter logistic models. The results indicate: (1) The three-parameter model fit the test data better in all cases than did the one-parameter model. For simulation data sets, multi-factor data were…
Descriptors: Comparative Analysis, Goodness of Fit, Item Analysis, Mathematical Models
Douglass, James B. – 1979
A general process for testing the feasibility of applying alternative mathematical or statistical models to the solution of a practical problem is presented and flowcharted. The system is used to compare five models for test equating: (1) anchor test equating using classical test theory; (2) anchor test equating using the one-parameter logistic…
Descriptors: Comparative Analysis, Equated Scores, Flow Charts, Goodness of Fit
Dowson, Martin; McInerney, Dennis M. – 1997
This paper outlines the development of a quantitative instrument designed to measure students' multiple achievement goals and key aspects of their cognitive engagement in Australian educational settings. The paper demonstrates the use of congeneric measurement models in assessing and improving the validity of the scales comprising the Goal…
Descriptors: Academic Achievement, Achievement Need, Cognitive Processes, Educational Objectives
Gustafsson, Jan-Eric – 1977
The Rasch model for test analysis is described and compared with two-parameter and three-parameter latent-trait models. Conditional maximum likelihood equations for estimating item parameters are derived, and estimates of person parameters are described together with their confidence intervals. Goodness of fit tests are discussed, including a…
Descriptors: Adaptive Testing, Computer Programs, Equated Scores, Error of Measurement
Farish, Stephen J. – 1984
The stability of Rasch test item difficulty parameters was investigated under varying conditions. Data were taken from a mathematics achievement test administered to over 2,000 Australian students. The experiments included: (1) relative stability of the Rasch, traditional, and z-item difficulty parameters using different sample sizes and designs;…
Descriptors: Achievement Tests, Difficulty Level, Estimation (Mathematics), Foreign Countries