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Download full textTourangeau, Karen; Nord, Christine; Lê, Thanh; Wallner-Allen, Kathleen; Vaden-Kiernan, Nancy; Blaker, Lisa; Najarian, Michelle – National Center for Education Statistics, 2018
This manual provides guidance and documentation for users of the longitudinal kindergarten-fourth grade (K-4) data file of the Early Childhood Longitudinal Study, Kindergarten Class of 2010-11 (ECLS-K:2011). It mainly provides information specific to the fourth-grade round of data collection. The first chapter provides an overview of the…
Descriptors: Children, Longitudinal Studies, Surveys, Kindergarten
Direct linkMrazik, Martin; Janzen, Troy M.; Dombrowski, Stefan C.; Barford, Sean W.; Krawchuk, Lindsey L. – Canadian Journal of School Psychology, 2012
A total of 19 graduate students enrolled in a graduate course conducted 6 consecutive administrations of the Wechsler Intelligence Scale for Children, 4th edition (WISC-IV, Canadian version). Test protocols were examined to obtain data describing the frequency of examiner errors, including administration and scoring errors. Results identified 511…
Descriptors: Intelligence Tests, Intelligence, Statistical Analysis, Scoring
Stuck, Ivan A. – 1990
Parallel merit reliability (PMR) indexes the same consistency of measurement that is reflected in a validity coefficient; it reflects the reliability of measurement across identical merit score cases. Research has identified the potential benefits of the PMR approach as providing item level and cut-score reliability indices without requiring…
Descriptors: Error of Measurement, Estimation (Mathematics), Research Methodology, Scoring
Carlson, James E.; Spray, Judith A. – 1986
This paper discussed methods currently under study for use with multiple-response data. Besides using Bonferroni inequality methods to control type one error rate over a set of inferences involving multiple response data, a recently proposed methodology of plotting the p-values resulting from multiple significance tests was explored. Proficiency…
Descriptors: Cutting Scores, Data Analysis, Difficulty Level, Error of Measurement
