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Pavlov, Goran; Maydeu-Olivares, Alberto; Shi, Dexin – Educational and Psychological Measurement, 2021
We examine the accuracy of p values obtained using the asymptotic mean and variance (MV) correction to the distribution of the sample standardized root mean squared residual (SRMR) proposed by Maydeu-Olivares to assess the exact fit of SEM models. In a simulation study, we found that under normality, the MV-corrected SRMR statistic provides…
Descriptors: Structural Equation Models, Goodness of Fit, Simulation, Error of Measurement
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Fergusson, Anna; Pfannkuch, Maxine – Journal of Statistics Education, 2020
Informally testing the fit of a probability distribution model is educationally a desirable precursor to formal methods for senior secondary school students. Limited research on how to teach such an informal approach, lack of statistically sound criteria to enable drawing of conclusions, as well as New Zealand assessment requirements led to this…
Descriptors: Foreign Countries, Statistics Education, Probability, Goodness of Fit
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Li, Jian; Lomax, Richard G. – Journal of Experimental Education, 2017
Using Monte Carlo simulations, this research examined the performance of four missing data methods in SEM under different multivariate distributional conditions. The effects of four independent variables (sample size, missing proportion, distribution shape, and factor loading magnitude) were investigated on six outcome variables: convergence rate,…
Descriptors: Monte Carlo Methods, Structural Equation Models, Evaluation Methods, Measurement Techniques
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Sengul Avsar, Asiye; Tavsancil, Ezel – Educational Sciences: Theory and Practice, 2017
This study analysed polytomous items' psychometric properties according to nonparametric item response theory (NIRT) models. Thus, simulated datasets--three different test lengths (10, 20 and 30 items), three sample distributions (normal, right and left skewed) and three samples sizes (100, 250 and 500)--were generated by conducting 20…
Descriptors: Test Items, Psychometrics, Nonparametric Statistics, Item Response Theory
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Skaggs, Gary; Wilkins, Jesse L. M.; Hein, Serge F. – International Journal of Testing, 2016
The purpose of this study was to explore the degree of grain size of the attributes and the sample sizes that can support accurate parameter recovery with the General Diagnostic Model (GDM) for a large-scale international assessment. In this resampling study, bootstrap samples were obtained from the 2003 Grade 8 TIMSS in Mathematics at varying…
Descriptors: Achievement Tests, Foreign Countries, Elementary Secondary Education, Science Achievement
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Beretvas, S. Natasha; Murphy, Daniel L. – Journal of Experimental Education, 2013
The authors assessed correct model identification rates of Akaike's information criterion (AIC), corrected criterion (AICC), consistent AIC (CAIC), Hannon and Quinn's information criterion (HQIC), and Bayesian information criterion (BIC) for selecting among cross-classified random effects models. Performance of default values for the 5…
Descriptors: Models, Goodness of Fit, Evaluation Criteria, Educational Research
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Tanguma, Jesus – Educational and Psychological Measurement, 2001
Studied the effects of sample size on the cumulative distribution of selected fit indices using Monte Carlo simulation. Generally, the comparative fit index exhibited very stable patterns and was less influenced by sample size or data types than were other fit indices. (SLD)
Descriptors: Goodness of Fit, Monte Carlo Methods, Sample Size, Simulation
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Anderson, Ronald D. – Structural Equation Modeling, 1996
Goodness of fit indexes developed by R. P. McDonald (1989) and Satorra-Bentler scale correction methods (A. Satorra and P. M. Bentler, 1988) were studied. The Satorra-Bentler index is shown to have the least error under each distributional misspecification level when the model has correct structural specification. (SLD)
Descriptors: Error of Measurement, Estimation (Mathematics), Goodness of Fit, Maximum Likelihood Statistics