Descriptor
| Difficulty Level | 1 |
| Item Sampling | 1 |
| Latent Trait Theory | 1 |
| Mathematical Models | 1 |
| Matrices | 1 |
| Probability | 1 |
| Sampling | 1 |
| Statistical Analysis | 1 |
| Test Interpretation | 1 |
| Test Items | 1 |
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| Applied Psychological… | 1 |
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| van der Linden, Wim J. | 1 |
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Peer reviewedvan der Linden, Wim J. – Applied Psychological Measurement, 1979
The restrictions on item difficulties that must be met when binomial models are applied to domain-referenced testing are examined. Both a deterministic and a stochastic conception of item responses are discussed with respect to difficulty and Guttman-type items. (Author/BH)
Descriptors: Difficulty Level, Item Sampling, Latent Trait Theory, Mathematical Models
