ERIC Number: ED292877
Record Type: Non-Journal
Publication Date: 1988-Jan-18
Pages: 31
Abstractor: N/A
ISBN: N/A
ISSN: N/A
EISSN: N/A
Available Date: N/A
Estimating Measures of Pass-Fail Reliability from Parallel Half-Tests.
Woodruff, David J.; Sawyer, Richard L.
Two methods for estimating measures of pass-fail reliability are derived, by which both theta and kappa may be estimated from a single test administration. The methods require only a single test administration and are computationally simple. Both are based on the Spearman-Brown formula for estimating stepped-up reliability. The non-distributional method requires only that the test be divisible into parallel half-tests; the normal method makes the additional assumption of normally distributed test scores. Bias for the two procedures is investigated by simulation, using a Monte Carlo study. For nearly normal test score distributions, the normal method performs slightly better than does the non-distributional method, but for moderately to severely skewed or symmetric platykurtic test score distributions, the non-distributional method is superior. Test results from a licensure examination are tabulated to illustrate the methods. (Author/SLD)
Publication Type: Reports - Evaluative; Speeches/Meeting Papers
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: American Coll. Testing Program, Iowa City, IA. Research Div.
Grant or Contract Numbers: N/A
Author Affiliations: N/A