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Download full textFeng, Mingyu, Ed.; Käser, Tanja, Ed.; Talukdar, Partha, Ed. – International Educational Data Mining Society, 2023
The Indian Institute of Science is proud to host the fully in-person sixteenth iteration of the International Conference on Educational Data Mining (EDM) during July 11-14, 2023. EDM is the annual flagship conference of the International Educational Data Mining Society. The theme of this year's conference is "Educational data mining for…
Descriptors: Information Retrieval, Data Analysis, Computer Assisted Testing, Cheating
Hu, Xiangen, Ed.; Barnes, Tiffany, Ed.; Hershkovitz, Arnon, Ed.; Paquette, Luc, Ed. – International Educational Data Mining Society, 2017
The 10th International Conference on Educational Data Mining (EDM 2017) is held under the auspices of the International Educational Data Mining Society at the Optics Velley Kingdom Plaza Hotel, Wuhan, Hubei Province, in China. This years conference features two invited talks by: Dr. Jie Tang, Associate Professor with the Department of Computer…
Descriptors: Data Analysis, Data Collection, Graphs, Data Use
Adams, Raymond J.; Khoo, Siek-Toon – 1993
The Quest program offers a comprehensive test and questionnaire analysis environment by providing a data analyst (a computer program) with access to the most recent developments in Rasch measurement theory, as well as a range of traditional analysis procedures. This manual helps the user use Quest to construct and validate variables based on…
Descriptors: Computer Assisted Testing, Computer Software, Estimation (Mathematics), Foreign Countries
Sebrechts, Marc M.; And Others – 1993
This report describes the development of a new tool for assessment research in graduate education. The tool, the Algebra Assessment System, is based on GIDE, a pre-existing program that diagnostically analyzes complex constructed responses to algebra word problems. The project had three goals. The first goal was to build a generically usable…
Descriptors: Algebra, College Entrance Examinations, Computer Assisted Testing, Computer Interfaces
