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Download full textFeng, Mingyu, Ed.; Käser, Tanja, Ed.; Talukdar, Partha, Ed. – International Educational Data Mining Society, 2023
The Indian Institute of Science is proud to host the fully in-person sixteenth iteration of the International Conference on Educational Data Mining (EDM) during July 11-14, 2023. EDM is the annual flagship conference of the International Educational Data Mining Society. The theme of this year's conference is "Educational data mining for…
Descriptors: Information Retrieval, Data Analysis, Computer Assisted Testing, Cheating
An Auto-Scoring Mechanism for Evaluating Problem-Solving Ability in a Web-Based Learning Environment
Direct linkChiou, Chuang-Kai; Hwang, Gwo-Jen; Tseng, Judy C. R. – Computers & Education, 2009
The rapid development of computer and network technologies has attracted researchers to investigate strategies for and the effects of applying information technologies in learning activities; simultaneously, learning environments have been developed to record the learning portfolios of students seeking web information for problem-solving. Although…
Descriptors: Learning Strategies, Problem Solving, Scoring, Student Evaluation
Hu, Xiangen, Ed.; Barnes, Tiffany, Ed.; Hershkovitz, Arnon, Ed.; Paquette, Luc, Ed. – International Educational Data Mining Society, 2017
The 10th International Conference on Educational Data Mining (EDM 2017) is held under the auspices of the International Educational Data Mining Society at the Optics Velley Kingdom Plaza Hotel, Wuhan, Hubei Province, in China. This years conference features two invited talks by: Dr. Jie Tang, Associate Professor with the Department of Computer…
Descriptors: Data Analysis, Data Collection, Graphs, Data Use
Peer reviewedBruno, James E. – Computers in the Schools, 1987
Discussion of how computer technology can be integrated into elementary school instruction focuses on evaluating student learning through test scoring. Highlights include descriptions of a computer-based instructional delivery system, modified confidence weighted admissible probability measurement (MCW-APM), and computer-managed instructional…
Descriptors: Computer Assisted Instruction, Computer Assisted Testing, Computer Managed Instruction, Confidence Testing
