Publication Date
In 2025 | 0 |
Since 2024 | 0 |
Since 2021 (last 5 years) | 1 |
Since 2016 (last 10 years) | 2 |
Since 2006 (last 20 years) | 2 |
Descriptor
Bayesian Statistics | 3 |
Simulation | 3 |
Comparative Analysis | 2 |
Item Response Theory | 2 |
Maximum Likelihood Statistics | 2 |
Test Items | 2 |
Accuracy | 1 |
Classification | 1 |
Computation | 1 |
Difficulty Level | 1 |
Educational Assessment | 1 |
More ▼ |
Source
Applied Measurement in… | 3 |
Publication Type
Journal Articles | 3 |
Reports - Research | 2 |
Reports - Evaluative | 1 |
Education Level
Audience
Location
Laws, Policies, & Programs
Assessments and Surveys
What Works Clearinghouse Rating
Kim, Stella Yun; Lee, Won-Chan – Applied Measurement in Education, 2023
This study evaluates various scoring methods including number-correct scoring, IRT theta scoring, and hybrid scoring in terms of scale-score stability over time. A simulation study was conducted to examine the relative performance of five scoring methods in terms of preserving the first two moments of scale scores for a population in a chain of…
Descriptors: Scoring, Comparative Analysis, Item Response Theory, Simulation
Koziol, Natalie A. – Applied Measurement in Education, 2016
Testlets, or groups of related items, are commonly included in educational assessments due to their many logistical and conceptual advantages. Despite their advantages, testlets introduce complications into the theory and practice of educational measurement. Responses to items within a testlet tend to be correlated even after controlling for…
Descriptors: Classification, Accuracy, Comparative Analysis, Models
Gao, Furong; Chen, Lisue – Applied Measurement in Education, 2005
Through a large-scale simulation study, this article compares item parameter estimates obtained by the marginal maximum likelihood estimation (MMLE) and marginal Bayes modal estimation (MBME) procedures in the 3-parameter logistic model. The impact of different prior specifications on the MBME estimates is also investigated using carefully…
Descriptors: Simulation, Computation, Bayesian Statistics, Item Analysis