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Joshua B. Gilbert; James S. Kim; Luke W. Miratrix – Applied Measurement in Education, 2024
Longitudinal models typically emphasize between-person predictors of change but ignore how growth varies "within" persons because each person contributes only one data point at each time. In contrast, modeling growth with multi-item assessments allows evaluation of how relative item performance may shift over time. While traditionally…
Descriptors: Vocabulary Development, Item Response Theory, Test Items, Student Development
Lee, Wooyeol; Cho, Sun-Joo – Applied Measurement in Education, 2017
Utilizing a longitudinal item response model, this study investigated the effect of item parameter drift (IPD) on item parameters and person scores via a Monte Carlo study. Item parameter recovery was investigated for various IPD patterns in terms of bias and root mean-square error (RMSE), and percentage of time the 95% confidence interval covered…
Descriptors: Item Response Theory, Test Items, Bias, Computation
Koziol, Natalie A. – Applied Measurement in Education, 2016
Testlets, or groups of related items, are commonly included in educational assessments due to their many logistical and conceptual advantages. Despite their advantages, testlets introduce complications into the theory and practice of educational measurement. Responses to items within a testlet tend to be correlated even after controlling for…
Descriptors: Classification, Accuracy, Comparative Analysis, Models
Zhang, Bo; Ohland, Matthew W. – Applied Measurement in Education, 2009
One major challenge in using group projects to assess student learning is accounting for the differences of contribution among group members so that the mark assigned to each individual actually reflects their performance. This research addresses the validity of grading group projects by evaluating different methods that derive individualized…
Descriptors: Monte Carlo Methods, Validity, Student Evaluation, Evaluation Methods
Wells, Craig S.; Bolt, Daniel M. – Applied Measurement in Education, 2008
Tests of model misfit are often performed to validate the use of a particular model in item response theory. Douglas and Cohen (2001) introduced a general nonparametric approach for detecting misfit under the two-parameter logistic model. However, the statistical properties of their approach, and empirical comparisons to other methods, have not…
Descriptors: Test Length, Test Items, Monte Carlo Methods, Nonparametric Statistics
Finch, Holmes; Monahan, Patrick – Applied Measurement in Education, 2008
This article introduces a bootstrap generalization to the Modified Parallel Analysis (MPA) method of test dimensionality assessment using factor analysis. This methodology, based on the use of Marginal Maximum Likelihood nonlinear factor analysis, provides for the calculation of a test statistic based on a parametric bootstrap using the MPA…
Descriptors: Monte Carlo Methods, Factor Analysis, Generalization, Methods
Wang, Wen-Chung; Su, Ya-Hui – Applied Measurement in Education, 2004
In this study we investigated the effects of the average signed area (ASA) between the item characteristic curves of the reference and focal groups and three test purification procedures on the uniform differential item functioning (DIF) detection via the Mantel-Haenszel (M-H) method through Monte Carlo simulations. The results showed that ASA,…
Descriptors: Test Bias, Student Evaluation, Evaluation Methods, Test Items