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Wainer, Howard | 1 |
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Huynh, Huynh – Journal of Educational Statistics, 1990
False positive and false negative error rates were studied for competency testing when failing examinees are permitted to retake the test. Formulas are provided for the beta-binomial and Rasch models. Estimates based on these models are compared for six data sets from the South Carolina Basic Skills Assessment Program. (SLD)
Descriptors: Elementary Secondary Education, Equations (Mathematics), Error Patterns, Estimation (Mathematics)

Wainer, Howard – Journal of Educational Statistics, 1990
It is suggested that some of the technology applied to state Scholastic Aptitude Test scores to measure states' educational performance (particularly use of a truncated Gaussian model) may make it possible to adjust National Assessment of Educational Progress (NAEP) scores to make inferences about state educational progress possible. (SLD)
Descriptors: Academic Achievement, Educational Assessment, Elementary Secondary Education, Mathematical Models