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Finch, W. Holmes – Applied Measurement in Education, 2016
Differential item functioning (DIF) assessment is a crucial component in test construction, serving as the primary way in which instrument developers ensure that measures perform in the same way for multiple groups within the population. When such is not the case, scores may not accurately reflect the trait of interest for all individuals in the…
Descriptors: Test Bias, Monte Carlo Methods, Comparative Analysis, Population Groups
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Lee, Wooyeol; Cho, Sun-Joo – Applied Measurement in Education, 2017
Utilizing a longitudinal item response model, this study investigated the effect of item parameter drift (IPD) on item parameters and person scores via a Monte Carlo study. Item parameter recovery was investigated for various IPD patterns in terms of bias and root mean-square error (RMSE), and percentage of time the 95% confidence interval covered…
Descriptors: Item Response Theory, Test Items, Bias, Computation
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Hawley, Leslie R.; Bovaird, James A.; Wu, ChaoRong – Applied Measurement in Education, 2017
Value-added assessment methods have been criticized by researchers and policy makers for a number of reasons. One issue includes the sensitivity of model results across different outcome measures. This study examined the utility of incorporating multivariate latent variable approaches within a traditional value-added framework. We evaluated the…
Descriptors: Value Added Models, Reliability, Multivariate Analysis, Scaling