Publication Date
In 2025 | 0 |
Since 2024 | 0 |
Since 2021 (last 5 years) | 3 |
Since 2016 (last 10 years) | 4 |
Since 2006 (last 20 years) | 4 |
Descriptor
Source
International Journal of… | 4 |
Author
Altintas, Ozge | 1 |
Kilmen, Sevilay | 1 |
Lee, Hyung Rock | 1 |
Lee, Sunbok | 1 |
Ozsoy, Seyma Nur | 1 |
Simsek, Ahmet Salih | 1 |
Sung, Jaeyun | 1 |
Wallin, Gabriel | 1 |
Publication Type
Journal Articles | 4 |
Reports - Research | 4 |
Education Level
Higher Education | 1 |
Junior High Schools | 1 |
Middle Schools | 1 |
Postsecondary Education | 1 |
Secondary Education | 1 |
Audience
Location
Turkey | 1 |
Laws, Policies, & Programs
Assessments and Surveys
What Works Clearinghouse Rating
Ozsoy, Seyma Nur; Kilmen, Sevilay – International Journal of Assessment Tools in Education, 2023
In this study, Kernel test equating methods were compared under NEAT and NEC designs. In NEAT design, Kernel post-stratification and chain equating methods taking into account optimal and large bandwidths were compared. In the NEC design, gender and/or computer/tablet use was considered as a covariate, and Kernel test equating methods were…
Descriptors: Equated Scores, Testing, Test Items, Statistical Analysis
Altintas, Ozge; Wallin, Gabriel – International Journal of Assessment Tools in Education, 2021
Educational assessment tests are designed to measure the same psychological constructs over extended periods. This feature is important considering that test results are often used for admittance to university programs. To ensure fair assessments, especially for those whose results weigh heavily in selection decisions, it is necessary to collect…
Descriptors: College Admission, College Entrance Examinations, Test Bias, Equated Scores
Simsek, Ahmet Salih – International Journal of Assessment Tools in Education, 2023
Likert-type item is the most popular response format for collecting data in social, educational, and psychological studies through scales or questionnaires. However, there is no consensus on whether parametric or non-parametric tests should be preferred when analyzing Likert-type data. This study examined the statistical power of parametric and…
Descriptors: Error of Measurement, Likert Scales, Nonparametric Statistics, Statistical Analysis
Lee, Hyung Rock; Lee, Sunbok; Sung, Jaeyun – International Journal of Assessment Tools in Education, 2019
Applying single-level statistical models to multilevel data typically produces underestimated standard errors, which may result in misleading conclusions. This study examined the impact of ignoring multilevel data structure on the estimation of item parameters and their standard errors of the Rasch, two-, and three-parameter logistic models in…
Descriptors: Item Response Theory, Computation, Error of Measurement, Test Bias