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Ozsoy, Seyma Nur; Kilmen, Sevilay – International Journal of Assessment Tools in Education, 2023
In this study, Kernel test equating methods were compared under NEAT and NEC designs. In NEAT design, Kernel post-stratification and chain equating methods taking into account optimal and large bandwidths were compared. In the NEC design, gender and/or computer/tablet use was considered as a covariate, and Kernel test equating methods were…
Descriptors: Equated Scores, Testing, Test Items, Statistical Analysis
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Altintas, Ozge; Wallin, Gabriel – International Journal of Assessment Tools in Education, 2021
Educational assessment tests are designed to measure the same psychological constructs over extended periods. This feature is important considering that test results are often used for admittance to university programs. To ensure fair assessments, especially for those whose results weigh heavily in selection decisions, it is necessary to collect…
Descriptors: College Admission, College Entrance Examinations, Test Bias, Equated Scores
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Simsek, Ahmet Salih – International Journal of Assessment Tools in Education, 2023
Likert-type item is the most popular response format for collecting data in social, educational, and psychological studies through scales or questionnaires. However, there is no consensus on whether parametric or non-parametric tests should be preferred when analyzing Likert-type data. This study examined the statistical power of parametric and…
Descriptors: Error of Measurement, Likert Scales, Nonparametric Statistics, Statistical Analysis
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Lee, Hyung Rock; Lee, Sunbok; Sung, Jaeyun – International Journal of Assessment Tools in Education, 2019
Applying single-level statistical models to multilevel data typically produces underestimated standard errors, which may result in misleading conclusions. This study examined the impact of ignoring multilevel data structure on the estimation of item parameters and their standard errors of the Rasch, two-, and three-parameter logistic models in…
Descriptors: Item Response Theory, Computation, Error of Measurement, Test Bias