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Wang, Chun; Chen, Ping; Jiang, Shengyu – Grantee Submission, 2019
Many large-scale educational surveys have moved from linear form design to multistage testing (MST) design. One advantage of MST is that it can provide more accurate latent trait [theta] estimates using fewer items than required by linear tests. However, MST generates incomplete response data by design; hence questions remain as to how to…
Descriptors: Adaptive Testing, Test Items, Item Response Theory, Maximum Likelihood Statistics
Cetin-Berber, Dee Duygu; Sari, Halil Ibrahim; Huggins-Manley, Anne Corinne – Educational and Psychological Measurement, 2019
Routing examinees to modules based on their ability level is a very important aspect in computerized adaptive multistage testing. However, the presence of missing responses may complicate estimation of examinee ability, which may result in misrouting of individuals. Therefore, missing responses should be handled carefully. This study investigated…
Descriptors: Computer Assisted Testing, Adaptive Testing, Error of Measurement, Research Problems
Kim, Sooyeon; Moses, Tim; Yoo, Hanwook Henry – ETS Research Report Series, 2015
The purpose of this inquiry was to investigate the effectiveness of item response theory (IRT) proficiency estimators in terms of estimation bias and error under multistage testing (MST). We chose a 2-stage MST design in which 1 adaptation to the examinees' ability levels takes place. It includes 4 modules (1 at Stage 1, 3 at Stage 2) and 3 paths…
Descriptors: Item Response Theory, Computation, Statistical Bias, Error of Measurement
Kuo, Bor-Chen; Daud, Muslem; Yang, Chih-Wei – EURASIA Journal of Mathematics, Science & Technology Education, 2015
This paper describes a curriculum-based multidimensional computerized adaptive test that was developed for Indonesia junior high school Biology. In adherence to the Indonesian curriculum of different Biology dimensions, 300 items was constructed, and then tested to 2238 students. A multidimensional random coefficients multinomial logit model was…
Descriptors: Secondary School Science, Science Education, Science Tests, Computer Assisted Testing

Chang, Hua-Hua; Ying, Zhiliang – Applied Psychological Measurement, 1996
An item selection procedure for computerized adaptive testing based on average global information is proposed. Results from simulation studies comparing the approach with the usual maximum item information item selection indicate that the new method leads to improvement in terms of bias and mean squared error reduction under many circumstances.…
Descriptors: Adaptive Testing, Computer Assisted Testing, Error of Measurement, Item Response Theory
Yi, Qing; Wang, Tianyou; Ban, Jae-Chun – 2000
Error indices (bias, standard error of estimation, and root mean square error) obtained on different scales of measurement under different test termination rules in a computerized adaptive test (CAT) context were examined. Four ability estimation methods were studied: (1) maximum likelihood estimation (MLE); (2) weighted likelihood estimation…
Descriptors: Ability, Adaptive Testing, Computer Assisted Testing, Error of Measurement
Patience, Wayne M.; Reckase, Mark D. – 1979
Simulated tailored tests were used to investigate the relationships between characteristics of the item pool and the computer program, and the reliability and bias of the resulting ability estimates. The computer program was varied to provide for various step sizes (differences in difficulty between successive steps) and different acceptance…
Descriptors: Adaptive Testing, Computer Assisted Testing, Computer Programs, Educational Testing
Patience, Wayne M.; Reckase, Mark D. – 1979
An experiment was performed with computer-generated data to investigate some of the operational characteristics of tailored testing as they are related to various provisions of the computer program and item pool. With respect to the computer program, two characteristics were varied: the size of the step of increase or decrease in item difficulty…
Descriptors: Adaptive Testing, Computer Assisted Testing, Difficulty Level, Error of Measurement